Phase-resolved correlation and its application to analysis of low-coherence interferograms

Abstract

A new signal-processing technique is proposed that involves a phase-resolved correlation method that one can use to determine the phase distribution of low-coherence interferograms. This method improves the sensitivity and resolution of low-coherence interferometers. The depth structure of an aluminum oxide–coated aluminum mirror was determined by use of a low-coherence interferometer with this method. Three signal peaks were successfully extracted from a noisy interferogram.

© 2001 Optical Society of America

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