Abstract

We report a new spectroscopic technique to measure simultaneously the intensity and the phase of second-harmonic (SH) radiation over a broad spectral range without laser tuning. Temporally separated SH pulses from two sources, excited by the same broad-bandwidth 15-fs Ti:sapphire fundamental pulse, interfere in a spectrometer to yield frequency-domain interference fringes. We demonstrate the technique by measuring the strongly bias-dependent phase of SH radiation from a $\mathrm{Si}/{\mathrm{SiO}}_2/\mathrm{Cr}$ metal-oxide-semiconductor capacitor in the spectral range of the Si $E_1$ critical point.

© 1999 Optical Society of America

Second-harmonic amplitude and phase spectroscopy by use of broad-bandwidth femtosecond pulses

P. T. Wilson, Y. Jiang, R. Carriles, and M. C. Downer
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Femtosecond carrier-induced screening of dc electric-field-induced second-harmonic generation at the Si(001)–SiO₂ interface

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Noncollinear second-harmonic generation in periodically poled KTiOPO₄ excited by the Bessel beam

A. Piskarskas, V. Smilgevičius, A. Stabinis, V. Jarutis, V. Pašiškevičius, S. Wang, J. Tellefsen, and F. Laurell
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