Abstract

We measure the transverse spatial distribution of the gain region for the 19.6-nm neonlike germanium laser line by use of a short amplifier, which is backlit by a longer laser, both of which are created by illumination of a germanium slab target with a series of short 100-ps pulses from the Nova laser. The backlighting technique enables us to reduce greatly the refraction effects that dominated previous imaging experiments and made direct gain measurements impossible. Measurements are made with a two-dimensional high-resolution spatial-imaging diagnostic, and simulations of the gain are compared with experiments.

© 1997 Optical Society of America

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