Determination of surface profile statistics from electromagnetic scattering data

Abstract

A new reverse Monte Carlo method for the determination of the surface profile statistics from differential reflection data for the scattering of electromagnetic radiation from rough surfaces is presented. The method is used to extract the power spectrum of the surface profile from scattering data recently measured by West and O’Donnell [J. Opt. Soc. Am. A 12, 390 (1995)]. Excellent agreement with the power spectrum of the surface profile measured by contact profilometry is obtained.

© 1997 Optical Society of America

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