Abstract

Near-field photodetection optical microscopy (NPOM) is a fundamentally new approach to near-field optical microscopy. This scanning-probe technique uses a nanometer-scale photodiode detector as a near-field optical probe. We have fabricated probes for NPOM that have optically sensitive areas as small as 100 nm × 100 nm. These new NPOM probes have been employed to image light transmitted through holes in an aluminum film. Near-surface optical interference is observed near defects and edges of the aluminum film. The optical edge response is shown to be of the order of 100 nm.

© 1996 Optical Society of America

Optical dipole model for photodetection in the near field

R. C. Davis and C. C. Williams
J. Opt. Soc. Am. A 18(7) 1543-1551 (2001)

Observation of nanometer-scale optical property discrimination by use of a near-field scanning apertureless microscope

P. M. Bridger and T. C. McGill
Opt. Lett. 24(15) 1005-1007 (1999)

Equivalence of constant-height and constant-intensity images in scanning near-field optical microscopy

Rémi Carminati and Jean-Jacques Greffet
Opt. Lett. 21(16) 1208-1210 (1996)

Infrared-reflection-mode near-field microscopy using an apertureless probe with a resolution of λ/600

A. Lahrech, R. Bachelot, P. Gleyzes, and A. C. Boccara
Opt. Lett. 21(17) 1315-1317 (1996)

Opto-mechanical probe for combining atomic force microscopy and optical near-field surface analysis

C. H. van Hoorn, D. C. Chavan, B. Tiribilli, G. Margheri, A. J. G. Mank, F. Ariese, and D. Iannuzzi
Opt. Lett. 39(16) 4800-4803 (2014)