Abstract

A new, handy method to evaluate phase data from fringe patterns produced by electronic speckle-pattern interferometry is proposed. The method is capable of evaluating phase data by simply taking speckle images and performing arithmetic operations on them. No extra optics or phase modulation is needed. Experiments have been carried out to prove the validity of the principle and demonstrate the capability of applications to practical deformation analyses.

© 1995 Optical Society of America

Evaluation of two-dimensional displacement components of symmetrical deformation by phase-shifting electronic speckle pattern interferometry

Ping Sun
Appl. Opt. 46(15) 2859-2862 (2007)

Technique for the removal of speckle phase in electronic speckle interferometry

Bruno F. Pouet and Sridhar Krishnaswamy
Opt. Lett. 20(3) 318-320 (1995)

Least-squares fitting of the phase map obtained in phase-shifting electronic speckle pattern interferometry

Chung Ki Hong, Hyun Surk Ryu, and Hyun Choon Lim
Opt. Lett. 20(8) 931-933 (1995)

Phase evaluation of speckle patterns during continuous deformation by use of phase-shifting speckle interferometry

Torgny E. Carlsson and An Wei
Appl. Opt. 39(16) 2628-2637 (2000)

Dynamic electronic speckle pattern interferometry (DESPI) phase analyses with temporal Hilbert transform

Violeta Dimitrova Madjarova, Hirofumi Kadono, and Satoru Toyooka
Opt. Express 11(6) 617-623 (2003)