Abstract

We demonstrate a novel optical phase detector that uses sum-frequency mixing in a nonlinear waveguide. By monitoring the near-field pattern of the sum-frequency light radiated from the waveguide surface, the relative phase of two input light beams can be measured. By using an AlxGa1−xAs waveguide optimized for sum-frequency generation with λ = 1.06 μm input light, we demonstrate a simple phase detector capable of resolving phase shifts of less than 0.2 rad. This phase detector is also used in an interferometer configuration as a gigahertz-resolution frequency monitor.

© 1992 Optical Society of America

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