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Measurement of the core proximity in polished fiber substrates and couplers

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Abstract

We report recent developments in a technique to measure the thickness of cladding remaining on polished single-mode fiber substrates. This technique relies on the measurement of the throughput attenuation resulting when a drop of liquid of appropriate refractive index is placed on the substrate. Applications to fiber couplers and other all-fiber devices are described.

© 1985 Optical Society of America

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