Q. Zhang, H. Xie, W. Shi, and B. Fan, “A novel sampling moiré method and its application for distortion calibration in scanning electron microscope,” Opt. Laser. Eng. 127, 105990 (2020).

[Crossref]

X. Chen and C.-C. Chang, “In-Plane Movement Measurement Technique Using Digital Sampling Moiré Method,” J. Bridge Eng. 24(4), 04019013 (2019).

[Crossref]

S. Ri, Q. Wang, P. Xia, and H. Tsuda, “Spatiotemporal phase-shifting method for accurate phase analysis of fringe pattern,” J. Opt. 21(9), 095702 (2019).

[Crossref]

Q. Wang, S. Ri, H. Tsuda, and M. Koyama, “Optical full-field strain measurement method from wrapped sampling Moiré phase to minimize the influence of defects and its applications,” Opt. Laser. Eng. 110, 155–162 (2018).

[Crossref]

Q. Zhang, H. Xie, Z. Liu, and W. Shi, “Sampling moiré method and its application to determine modulus of thermal barrier coatings under scanning electron microscope,” Opt. Laser. Eng. 107, 315–324 (2018).

[Crossref]

C. Zuo, S. Feng, L. Huang, T. Tao, W. Yin, and Q. Chen, “Phase shifting algorithms for fringe projection profilometry: A review,” Opt. Laser. Eng. 109, 23–59 (2018).

[Crossref]

S. Yoneyama, P. G. Ifju, and S. E. Rohde, “Identifying through-thickness material properties of carbon-fiber-reinforced plastics using the virtual fields method combined with moiré interferometry,” Adv. Compos. Mater. 27(1), 1–17 (2018).

[Crossref]

Q. Wang, S. Ri, and H. Tsuda, “Digital sampling Moiré as a substitute for microscope scanning Moiré for high-sensitivity and full-field deformation measurement at micron/nano scales,” Appl. Opt. 55(25), 6858–6865 (2016).

[Crossref]

M. Servin, M. Padilla, G. Garnica, and A. Gonzalez, “Profilometry of three-dimensional discontinuous solids by combining two-steps temporal phase unwrapping, co-phased profilometry and phase-shifting interferometry,” Opt. Laser. Eng. 87, 75–82 (2016).

[Crossref]

C. Li, H. Xie, Z. Liu, S. Wang, and L. Li, “Experimental study on stress concentration of nickel-base superalloy at elevated temperatures with an in situ SEM system,” Mech. Mater. 103, 87–94 (2016).

[Crossref]

W. Niu, L. Zhong, P. Sun, W. Zhang, and X. Lu, “Two-step phase retrieval algorithm based on the quotient of inner products of phase-shifting interferograms,” J. Opt. 17(8), 085703 (2015).

[Crossref]

H. Zhang, C. Wu, Z. Liu, and H. Xie, “A curved surface micro-moiré method and its application in evaluating curved surface residual stress,” Meas. Sci. Technol. 25(9), 095002 (2014).

[Crossref]

Q. Wang, S. Kishimoto, X. Jiang, and Y. Yamauchi, “Formation of secondary Moiré patterns for characterization of nanoporous alumina structures in multiple domains with different orientations,” Nanoscale 5(6), 2285–2289 (2013).

[Crossref]

C. Li, Z. Liu, H. Xie, and D. Wu, “Novel 3D SEM Moiré method for micro height measurement,” Opt. Express 21(13), 15734–15746 (2013).

[Crossref]

Q. Wang and S. Kishimoto, “Simultaneous analysis of residual stress and stress intensity factor in a resist after UV-nanoimprint lithography based on electron moiré fringes,” J. Micromech. Microeng. 22(10), 105021 (2012).

[Crossref]

J. Shao, Y. Ding, H. Tian, X. Li, X. Li, and H. Liu, “Digital moiré fringe measurement method for alignment in imprint lithography,” Opt. Laser Technol. 44(2), 446–451 (2012).

[Crossref]

J. Vargas, J. A. Quiroga, C. Sorzano, J. Estrada, and J. Carazo, “Two-step demodulation based on the Gram–Schmidt orthonormalization method,” Opt. Lett. 37(3), 443–445 (2012).

[Crossref]

Z. Lei and Z. Wang, “Vibration testing parameters measured by sampling moire method,” Appl. Mech. Mater. 226-228, 1975–1980 (2012).

[Crossref]

E. Hack and J. Burke, “Invited review article: measurement uncertainty of linear phase-stepping algorithms,” Rev. Sci. Instrum. 82(6), 061101 (2011).

[Crossref]

M. Fujigaki, A. Masaya, K. Shimo, and Y. Morimoto, “Dynamic shape and strain measurements of rotating tire using a sampling moiré method,” Opt. Eng. 50(10), 101506 (2011).

[Crossref]

S. K. Debnath and Y. Park, “Real-time quantitative phase imaging with a spatial phase-shifting algorithm,” Opt. Lett. 36(23), 4677–4679 (2011).

[Crossref]

P. Ifju and B. Han, “Recent applications of moiré interferometry,” Exp. Mech. 50(8), 1129–1147 (2010).

[Crossref]

M. Tang, H. Xie, Q. Wang, and J. Zhu, “Phase-shifting laser scanning confocal microscopy moiré method and its applications,” Meas. Sci. Technol. 21(5), 055110 (2010).

[Crossref]

S. Ri, M. Fujigaki, and Y. Morimoto, “Sampling moiré method for accurate small deformation distribution measurement,” Exp. Mech. 50(4), 501–508 (2010).

[Crossref]

H. Xie, H. Shang, F. Dai, B. Li, and Y. Xing, “Phase shifting SEM moiré method,” Opt. Laser Technol. 36(4), 291–297 (2004).

[Crossref]

Q. Kemao, “Windowed Fourier transform for fringe pattern analysis,” Appl. Opt. 43(13), 2695–2702 (2004).

[Crossref]

S. Avril, A. Vautrin, and Y. Surrel, “Grid method: application to the characterization of cracks,” Exp. Mech. 44(1), 37–43 (2004).

[Crossref]

F. Dai and Z. Wang, “Automatic fringe patterns analysis using digital processing tehniques: I fringe center method,” Acta Photonica Sin. 28, 700–706 (1999).

M. Hÿch and L. Potez, “Geometric phase analysis of high-resolution electron microscopy images of antiphase domains: example Cu3Au,” Philos. Mag. A 76(6), 1119–1138 (1997).

[Crossref]

S. Kishimoto, M. Egashira, and N. Shinya, “Microcreep deformation measurements by a moiré method using electron beam lithography and electron beam scan,” Opt. Eng. 32(3), 522–526 (1993).

[Crossref]

T. Chu, W. Ranson, and M. A. Sutton, “Applications of digital-image-correlation techniques to experimental mechanics,” Exp. Mech. 25(3), 232–244 (1985).

[Crossref]

M. Takeda, H. Ina, and S. Kobayashi, “Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry,” J. Opt. Soc. Am. A 72(1), 156–160 (1982).

[Crossref]

S. Avril, A. Vautrin, and Y. Surrel, “Grid method: application to the characterization of cracks,” Exp. Mech. 44(1), 37–43 (2004).

[Crossref]

E. Hack and J. Burke, “Invited review article: measurement uncertainty of linear phase-stepping algorithms,” Rev. Sci. Instrum. 82(6), 061101 (2011).

[Crossref]

X. Chen and C.-C. Chang, “In-Plane Movement Measurement Technique Using Digital Sampling Moiré Method,” J. Bridge Eng. 24(4), 04019013 (2019).

[Crossref]

C. Zuo, S. Feng, L. Huang, T. Tao, W. Yin, and Q. Chen, “Phase shifting algorithms for fringe projection profilometry: A review,” Opt. Laser. Eng. 109, 23–59 (2018).

[Crossref]

X. Chen and C.-C. Chang, “In-Plane Movement Measurement Technique Using Digital Sampling Moiré Method,” J. Bridge Eng. 24(4), 04019013 (2019).

[Crossref]

T. Chu, W. Ranson, and M. A. Sutton, “Applications of digital-image-correlation techniques to experimental mechanics,” Exp. Mech. 25(3), 232–244 (1985).

[Crossref]

H. Xie, H. Shang, F. Dai, B. Li, and Y. Xing, “Phase shifting SEM moiré method,” Opt. Laser Technol. 36(4), 291–297 (2004).

[Crossref]

F. Dai and Z. Wang, “Automatic fringe patterns analysis using digital processing tehniques: I fringe center method,” Acta Photonica Sin. 28, 700–706 (1999).

J. Shao, Y. Ding, H. Tian, X. Li, X. Li, and H. Liu, “Digital moiré fringe measurement method for alignment in imprint lithography,” Opt. Laser Technol. 44(2), 446–451 (2012).

[Crossref]

S. Kishimoto, M. Egashira, and N. Shinya, “Microcreep deformation measurements by a moiré method using electron beam lithography and electron beam scan,” Opt. Eng. 32(3), 522–526 (1993).

[Crossref]

Q. Zhang, H. Xie, W. Shi, and B. Fan, “A novel sampling moiré method and its application for distortion calibration in scanning electron microscope,” Opt. Laser. Eng. 127, 105990 (2020).

[Crossref]

C. Zuo, S. Feng, L. Huang, T. Tao, W. Yin, and Q. Chen, “Phase shifting algorithms for fringe projection profilometry: A review,” Opt. Laser. Eng. 109, 23–59 (2018).

[Crossref]

M. Fujigaki, A. Masaya, K. Shimo, and Y. Morimoto, “Dynamic shape and strain measurements of rotating tire using a sampling moiré method,” Opt. Eng. 50(10), 101506 (2011).

[Crossref]

S. Ri, M. Fujigaki, and Y. Morimoto, “Sampling moiré method for accurate small deformation distribution measurement,” Exp. Mech. 50(4), 501–508 (2010).

[Crossref]

Y. Fukami, S. Ri, Q. Wang, H. Tsuda, R. Kitamura, and S. Ogihara, “Accuracy improvement of small strain distribution measurement based on the sampling moire method with multi-step filter processing,” in Asian Conference on Experimental Mechanics, 160195, 98–99 (2016).

M. Servin, M. Padilla, G. Garnica, and A. Gonzalez, “Profilometry of three-dimensional discontinuous solids by combining two-steps temporal phase unwrapping, co-phased profilometry and phase-shifting interferometry,” Opt. Laser. Eng. 87, 75–82 (2016).

[Crossref]

M. Servin, M. Padilla, G. Garnica, and A. Gonzalez, “Profilometry of three-dimensional discontinuous solids by combining two-steps temporal phase unwrapping, co-phased profilometry and phase-shifting interferometry,” Opt. Laser. Eng. 87, 75–82 (2016).

[Crossref]

E. Hack and J. Burke, “Invited review article: measurement uncertainty of linear phase-stepping algorithms,” Rev. Sci. Instrum. 82(6), 061101 (2011).

[Crossref]

P. Ifju and B. Han, “Recent applications of moiré interferometry,” Exp. Mech. 50(8), 1129–1147 (2010).

[Crossref]

C. Zuo, S. Feng, L. Huang, T. Tao, W. Yin, and Q. Chen, “Phase shifting algorithms for fringe projection profilometry: A review,” Opt. Laser. Eng. 109, 23–59 (2018).

[Crossref]

M. Hÿch and L. Potez, “Geometric phase analysis of high-resolution electron microscopy images of antiphase domains: example Cu3Au,” Philos. Mag. A 76(6), 1119–1138 (1997).

[Crossref]

P. Ifju and B. Han, “Recent applications of moiré interferometry,” Exp. Mech. 50(8), 1129–1147 (2010).

[Crossref]

S. Yoneyama, P. G. Ifju, and S. E. Rohde, “Identifying through-thickness material properties of carbon-fiber-reinforced plastics using the virtual fields method combined with moiré interferometry,” Adv. Compos. Mater. 27(1), 1–17 (2018).

[Crossref]

M. Takeda, H. Ina, and S. Kobayashi, “Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry,” J. Opt. Soc. Am. A 72(1), 156–160 (1982).

[Crossref]

Q. Wang, S. Kishimoto, X. Jiang, and Y. Yamauchi, “Formation of secondary Moiré patterns for characterization of nanoporous alumina structures in multiple domains with different orientations,” Nanoscale 5(6), 2285–2289 (2013).

[Crossref]

Q. Wang, S. Kishimoto, X. Jiang, and Y. Yamauchi, “Formation of secondary Moiré patterns for characterization of nanoporous alumina structures in multiple domains with different orientations,” Nanoscale 5(6), 2285–2289 (2013).

[Crossref]

Q. Wang and S. Kishimoto, “Simultaneous analysis of residual stress and stress intensity factor in a resist after UV-nanoimprint lithography based on electron moiré fringes,” J. Micromech. Microeng. 22(10), 105021 (2012).

[Crossref]

S. Kishimoto, M. Egashira, and N. Shinya, “Microcreep deformation measurements by a moiré method using electron beam lithography and electron beam scan,” Opt. Eng. 32(3), 522–526 (1993).

[Crossref]

Y. Fukami, S. Ri, Q. Wang, H. Tsuda, R. Kitamura, and S. Ogihara, “Accuracy improvement of small strain distribution measurement based on the sampling moire method with multi-step filter processing,” in Asian Conference on Experimental Mechanics, 160195, 98–99 (2016).

M. Takeda, H. Ina, and S. Kobayashi, “Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry,” J. Opt. Soc. Am. A 72(1), 156–160 (1982).

[Crossref]

Q. Wang, S. Ri, H. Tsuda, and M. Koyama, “Optical full-field strain measurement method from wrapped sampling Moiré phase to minimize the influence of defects and its applications,” Opt. Laser. Eng. 110, 155–162 (2018).

[Crossref]

Q. Wang, S. Ri, H. Tsuda, M. Koyama, and K. Tsuzaki, “Two-dimensional Moire phase analysis for accurate strain distribution measurement and application in crack prediction,” Opt. Express 25(12), 13465–13480 (2017).

[Crossref]

Z. Lei and Z. Wang, “Vibration testing parameters measured by sampling moire method,” Appl. Mech. Mater. 226-228, 1975–1980 (2012).

[Crossref]

H. Xie, H. Shang, F. Dai, B. Li, and Y. Xing, “Phase shifting SEM moiré method,” Opt. Laser Technol. 36(4), 291–297 (2004).

[Crossref]

C. Li, H. Xie, Z. Liu, S. Wang, and L. Li, “Experimental study on stress concentration of nickel-base superalloy at elevated temperatures with an in situ SEM system,” Mech. Mater. 103, 87–94 (2016).

[Crossref]

C. Li, Z. Liu, H. Xie, and D. Wu, “Novel 3D SEM Moiré method for micro height measurement,” Opt. Express 21(13), 15734–15746 (2013).

[Crossref]

C. Li, H. Xie, Z. Liu, S. Wang, and L. Li, “Experimental study on stress concentration of nickel-base superalloy at elevated temperatures with an in situ SEM system,” Mech. Mater. 103, 87–94 (2016).

[Crossref]

J. Shao, Y. Ding, H. Tian, X. Li, X. Li, and H. Liu, “Digital moiré fringe measurement method for alignment in imprint lithography,” Opt. Laser Technol. 44(2), 446–451 (2012).

[Crossref]

J. Shao, Y. Ding, H. Tian, X. Li, X. Li, and H. Liu, “Digital moiré fringe measurement method for alignment in imprint lithography,” Opt. Laser Technol. 44(2), 446–451 (2012).

[Crossref]

J. Shao, Y. Ding, H. Tian, X. Li, X. Li, and H. Liu, “Digital moiré fringe measurement method for alignment in imprint lithography,” Opt. Laser Technol. 44(2), 446–451 (2012).

[Crossref]

Q. Zhang, H. Xie, Z. Liu, and W. Shi, “Sampling moiré method and its application to determine modulus of thermal barrier coatings under scanning electron microscope,” Opt. Laser. Eng. 107, 315–324 (2018).

[Crossref]

C. Li, H. Xie, Z. Liu, S. Wang, and L. Li, “Experimental study on stress concentration of nickel-base superalloy at elevated temperatures with an in situ SEM system,” Mech. Mater. 103, 87–94 (2016).

[Crossref]

H. Zhang, C. Wu, Z. Liu, and H. Xie, “A curved surface micro-moiré method and its application in evaluating curved surface residual stress,” Meas. Sci. Technol. 25(9), 095002 (2014).

[Crossref]

C. Li, Z. Liu, H. Xie, and D. Wu, “Novel 3D SEM Moiré method for micro height measurement,” Opt. Express 21(13), 15734–15746 (2013).

[Crossref]

W. Niu, L. Zhong, P. Sun, W. Zhang, and X. Lu, “Two-step phase retrieval algorithm based on the quotient of inner products of phase-shifting interferograms,” J. Opt. 17(8), 085703 (2015).

[Crossref]

M. Fujigaki, A. Masaya, K. Shimo, and Y. Morimoto, “Dynamic shape and strain measurements of rotating tire using a sampling moiré method,” Opt. Eng. 50(10), 101506 (2011).

[Crossref]

M. Fujigaki, A. Masaya, K. Shimo, and Y. Morimoto, “Dynamic shape and strain measurements of rotating tire using a sampling moiré method,” Opt. Eng. 50(10), 101506 (2011).

[Crossref]

S. Ri, M. Fujigaki, and Y. Morimoto, “Sampling moiré method for accurate small deformation distribution measurement,” Exp. Mech. 50(4), 501–508 (2010).

[Crossref]

W. Niu, L. Zhong, P. Sun, W. Zhang, and X. Lu, “Two-step phase retrieval algorithm based on the quotient of inner products of phase-shifting interferograms,” J. Opt. 17(8), 085703 (2015).

[Crossref]

Y. Fukami, S. Ri, Q. Wang, H. Tsuda, R. Kitamura, and S. Ogihara, “Accuracy improvement of small strain distribution measurement based on the sampling moire method with multi-step filter processing,” in Asian Conference on Experimental Mechanics, 160195, 98–99 (2016).

M. Servin, M. Padilla, G. Garnica, and A. Gonzalez, “Profilometry of three-dimensional discontinuous solids by combining two-steps temporal phase unwrapping, co-phased profilometry and phase-shifting interferometry,” Opt. Laser. Eng. 87, 75–82 (2016).

[Crossref]

M. Hÿch and L. Potez, “Geometric phase analysis of high-resolution electron microscopy images of antiphase domains: example Cu3Au,” Philos. Mag. A 76(6), 1119–1138 (1997).

[Crossref]

T. Chu, W. Ranson, and M. A. Sutton, “Applications of digital-image-correlation techniques to experimental mechanics,” Exp. Mech. 25(3), 232–244 (1985).

[Crossref]

S. Ri, Q. Wang, P. Xia, and H. Tsuda, “Spatiotemporal phase-shifting method for accurate phase analysis of fringe pattern,” J. Opt. 21(9), 095702 (2019).

[Crossref]

Q. Wang, S. Ri, H. Tsuda, and M. Koyama, “Optical full-field strain measurement method from wrapped sampling Moiré phase to minimize the influence of defects and its applications,” Opt. Laser. Eng. 110, 155–162 (2018).

[Crossref]

Q. Wang, S. Ri, H. Tsuda, M. Koyama, and K. Tsuzaki, “Two-dimensional Moire phase analysis for accurate strain distribution measurement and application in crack prediction,” Opt. Express 25(12), 13465–13480 (2017).

[Crossref]

Q. Wang, S. Ri, and H. Tsuda, “Digital sampling Moiré as a substitute for microscope scanning Moiré for high-sensitivity and full-field deformation measurement at micron/nano scales,” Appl. Opt. 55(25), 6858–6865 (2016).

[Crossref]

S. Ri, M. Fujigaki, and Y. Morimoto, “Sampling moiré method for accurate small deformation distribution measurement,” Exp. Mech. 50(4), 501–508 (2010).

[Crossref]

Y. Fukami, S. Ri, Q. Wang, H. Tsuda, R. Kitamura, and S. Ogihara, “Accuracy improvement of small strain distribution measurement based on the sampling moire method with multi-step filter processing,” in Asian Conference on Experimental Mechanics, 160195, 98–99 (2016).

S. Yoneyama, P. G. Ifju, and S. E. Rohde, “Identifying through-thickness material properties of carbon-fiber-reinforced plastics using the virtual fields method combined with moiré interferometry,” Adv. Compos. Mater. 27(1), 1–17 (2018).

[Crossref]

M. Servin, M. Padilla, G. Garnica, and A. Gonzalez, “Profilometry of three-dimensional discontinuous solids by combining two-steps temporal phase unwrapping, co-phased profilometry and phase-shifting interferometry,” Opt. Laser. Eng. 87, 75–82 (2016).

[Crossref]

H. Xie, H. Shang, F. Dai, B. Li, and Y. Xing, “Phase shifting SEM moiré method,” Opt. Laser Technol. 36(4), 291–297 (2004).

[Crossref]

J. Shao, Y. Ding, H. Tian, X. Li, X. Li, and H. Liu, “Digital moiré fringe measurement method for alignment in imprint lithography,” Opt. Laser Technol. 44(2), 446–451 (2012).

[Crossref]

Q. Zhang, H. Xie, W. Shi, and B. Fan, “A novel sampling moiré method and its application for distortion calibration in scanning electron microscope,” Opt. Laser. Eng. 127, 105990 (2020).

[Crossref]

Q. Zhang, H. Xie, Z. Liu, and W. Shi, “Sampling moiré method and its application to determine modulus of thermal barrier coatings under scanning electron microscope,” Opt. Laser. Eng. 107, 315–324 (2018).

[Crossref]

M. Fujigaki, A. Masaya, K. Shimo, and Y. Morimoto, “Dynamic shape and strain measurements of rotating tire using a sampling moiré method,” Opt. Eng. 50(10), 101506 (2011).

[Crossref]

S. Kishimoto, M. Egashira, and N. Shinya, “Microcreep deformation measurements by a moiré method using electron beam lithography and electron beam scan,” Opt. Eng. 32(3), 522–526 (1993).

[Crossref]

W. Niu, L. Zhong, P. Sun, W. Zhang, and X. Lu, “Two-step phase retrieval algorithm based on the quotient of inner products of phase-shifting interferograms,” J. Opt. 17(8), 085703 (2015).

[Crossref]

S. Avril, A. Vautrin, and Y. Surrel, “Grid method: application to the characterization of cracks,” Exp. Mech. 44(1), 37–43 (2004).

[Crossref]

T. Chu, W. Ranson, and M. A. Sutton, “Applications of digital-image-correlation techniques to experimental mechanics,” Exp. Mech. 25(3), 232–244 (1985).

[Crossref]

M. Takeda, H. Ina, and S. Kobayashi, “Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry,” J. Opt. Soc. Am. A 72(1), 156–160 (1982).

[Crossref]

M. Tang, H. Xie, Q. Wang, and J. Zhu, “Phase-shifting laser scanning confocal microscopy moiré method and its applications,” Meas. Sci. Technol. 21(5), 055110 (2010).

[Crossref]

C. Zuo, S. Feng, L. Huang, T. Tao, W. Yin, and Q. Chen, “Phase shifting algorithms for fringe projection profilometry: A review,” Opt. Laser. Eng. 109, 23–59 (2018).

[Crossref]

J. Shao, Y. Ding, H. Tian, X. Li, X. Li, and H. Liu, “Digital moiré fringe measurement method for alignment in imprint lithography,” Opt. Laser Technol. 44(2), 446–451 (2012).

[Crossref]

S. Ri, Q. Wang, P. Xia, and H. Tsuda, “Spatiotemporal phase-shifting method for accurate phase analysis of fringe pattern,” J. Opt. 21(9), 095702 (2019).

[Crossref]

Q. Wang, S. Ri, H. Tsuda, and M. Koyama, “Optical full-field strain measurement method from wrapped sampling Moiré phase to minimize the influence of defects and its applications,” Opt. Laser. Eng. 110, 155–162 (2018).

[Crossref]

Q. Wang, S. Ri, H. Tsuda, M. Koyama, and K. Tsuzaki, “Two-dimensional Moire phase analysis for accurate strain distribution measurement and application in crack prediction,” Opt. Express 25(12), 13465–13480 (2017).

[Crossref]

Q. Wang, S. Ri, and H. Tsuda, “Digital sampling Moiré as a substitute for microscope scanning Moiré for high-sensitivity and full-field deformation measurement at micron/nano scales,” Appl. Opt. 55(25), 6858–6865 (2016).

[Crossref]

Y. Fukami, S. Ri, Q. Wang, H. Tsuda, R. Kitamura, and S. Ogihara, “Accuracy improvement of small strain distribution measurement based on the sampling moire method with multi-step filter processing,” in Asian Conference on Experimental Mechanics, 160195, 98–99 (2016).

S. Avril, A. Vautrin, and Y. Surrel, “Grid method: application to the characterization of cracks,” Exp. Mech. 44(1), 37–43 (2004).

[Crossref]

S. Ri, Q. Wang, P. Xia, and H. Tsuda, “Spatiotemporal phase-shifting method for accurate phase analysis of fringe pattern,” J. Opt. 21(9), 095702 (2019).

[Crossref]

Q. Wang, S. Ri, H. Tsuda, and M. Koyama, “Optical full-field strain measurement method from wrapped sampling Moiré phase to minimize the influence of defects and its applications,” Opt. Laser. Eng. 110, 155–162 (2018).

[Crossref]

Q. Wang, S. Ri, H. Tsuda, M. Koyama, and K. Tsuzaki, “Two-dimensional Moire phase analysis for accurate strain distribution measurement and application in crack prediction,” Opt. Express 25(12), 13465–13480 (2017).

[Crossref]

Q. Wang, S. Ri, and H. Tsuda, “Digital sampling Moiré as a substitute for microscope scanning Moiré for high-sensitivity and full-field deformation measurement at micron/nano scales,” Appl. Opt. 55(25), 6858–6865 (2016).

[Crossref]

Q. Wang, S. Kishimoto, X. Jiang, and Y. Yamauchi, “Formation of secondary Moiré patterns for characterization of nanoporous alumina structures in multiple domains with different orientations,” Nanoscale 5(6), 2285–2289 (2013).

[Crossref]

Q. Wang and S. Kishimoto, “Simultaneous analysis of residual stress and stress intensity factor in a resist after UV-nanoimprint lithography based on electron moiré fringes,” J. Micromech. Microeng. 22(10), 105021 (2012).

[Crossref]

M. Tang, H. Xie, Q. Wang, and J. Zhu, “Phase-shifting laser scanning confocal microscopy moiré method and its applications,” Meas. Sci. Technol. 21(5), 055110 (2010).

[Crossref]

Y. Fukami, S. Ri, Q. Wang, H. Tsuda, R. Kitamura, and S. Ogihara, “Accuracy improvement of small strain distribution measurement based on the sampling moire method with multi-step filter processing,” in Asian Conference on Experimental Mechanics, 160195, 98–99 (2016).

C. Li, H. Xie, Z. Liu, S. Wang, and L. Li, “Experimental study on stress concentration of nickel-base superalloy at elevated temperatures with an in situ SEM system,” Mech. Mater. 103, 87–94 (2016).

[Crossref]

Z. Lei and Z. Wang, “Vibration testing parameters measured by sampling moire method,” Appl. Mech. Mater. 226-228, 1975–1980 (2012).

[Crossref]

F. Dai and Z. Wang, “Automatic fringe patterns analysis using digital processing tehniques: I fringe center method,” Acta Photonica Sin. 28, 700–706 (1999).

H. Zhang, C. Wu, Z. Liu, and H. Xie, “A curved surface micro-moiré method and its application in evaluating curved surface residual stress,” Meas. Sci. Technol. 25(9), 095002 (2014).

[Crossref]

S. Ri, Q. Wang, P. Xia, and H. Tsuda, “Spatiotemporal phase-shifting method for accurate phase analysis of fringe pattern,” J. Opt. 21(9), 095702 (2019).

[Crossref]

Q. Zhang, H. Xie, W. Shi, and B. Fan, “A novel sampling moiré method and its application for distortion calibration in scanning electron microscope,” Opt. Laser. Eng. 127, 105990 (2020).

[Crossref]

Q. Zhang, H. Xie, Z. Liu, and W. Shi, “Sampling moiré method and its application to determine modulus of thermal barrier coatings under scanning electron microscope,” Opt. Laser. Eng. 107, 315–324 (2018).

[Crossref]

C. Li, H. Xie, Z. Liu, S. Wang, and L. Li, “Experimental study on stress concentration of nickel-base superalloy at elevated temperatures with an in situ SEM system,” Mech. Mater. 103, 87–94 (2016).

[Crossref]

H. Zhang, C. Wu, Z. Liu, and H. Xie, “A curved surface micro-moiré method and its application in evaluating curved surface residual stress,” Meas. Sci. Technol. 25(9), 095002 (2014).

[Crossref]

C. Li, Z. Liu, H. Xie, and D. Wu, “Novel 3D SEM Moiré method for micro height measurement,” Opt. Express 21(13), 15734–15746 (2013).

[Crossref]

M. Tang, H. Xie, Q. Wang, and J. Zhu, “Phase-shifting laser scanning confocal microscopy moiré method and its applications,” Meas. Sci. Technol. 21(5), 055110 (2010).

[Crossref]

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