We propose an accurate and easy-to-use three-dimensional measurement method using a diffuser plate to analyze the scattering characteristics of optical films. The far-field radiation pattern of light scattered by the optical film is obtained from the illuminance pattern created on the diffuser plate by the light. A mathematical model and calibration methods were described, and the results were compared with those obtained by a direct measurement using a luminance meter. The new method gave very precise three-dimensional polarization-dependent scattering characteristics of scattering polarizer films, and it can play an effective role in developing high performance polarization-selective screens for 3D display applications.
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