M. R. Foreman, C. L. Giusca, J. M. Coupland, P. Török, and R. K. Leach, “Determination of the transfer function for optical surface topography measuring instruments - a review,” Meas. Sci. Technol. 24(5), 052001 (2013).

[Crossref]

J. Coupland, R. Mandal, K. Palodhi, and R. Leach, “Coherence scanning interferometry: linear theory of surface measurement,” Appl. Opt. 52(16), 3662–3670 (2013).

[Crossref]
[PubMed]

R. Mandal, K. Palodhi, J. Coupland, R. Leach, and D. Mansfield, “Application of linear systems theory to characterize coherence scanning interferometry,” Proc. SPIE 8430, 84300T (2012).

J. M. Coupland and J. Lobera, “Holography, tomography and 3D microscopy as linear filtering operations,” Meas. Sci. Technol. 19(7), 074012 (2008).

[Crossref]

L. Onural, “Impulse functions over curves and surfaces and their applications to diffraction,” J. Math. Anal. Appl. 322, 18–27 (2006).

[Crossref]

P. Sarder and A. Nehorai, “Deconvolution methods for 3-D fluorescence microscopy images,” IEEE Signal Process. Mag. 23(3), 32–45 (2006).

[Crossref]

J. L. Beverage, R. V. Shack, and M. R. Descour, “Measurement of the three-dimensional microscope point spread function using a Shack-Hartmann wavefront sensor,” J. Microsc. 205(1), 61–75 (2002).

[Crossref]
[PubMed]

W. Wallace, L. H. Schaefer, and J. R. Swedlow, “A working person’s guide to deconvolution in light microscopy,” Biotechniques 31(5), 1076–1097 (2001).

[PubMed]

J. G. McNally, T. Karpova, J. Cooper, and J. A. Conchello, “Three-dimensional imaging by deconvolution microscopy,” Methods 19(3), 373–385 (1999).

[Crossref]
[PubMed]

P. de Groot and L. Deck, “Surface profiling by analysis of white-light interferograms in the spatial frequency domain,” J. Mod. Opt. 42(2), 389–401 (1995).

[Crossref]

N. Balasubramanian, “Optical system for surface topography measurement,” U.S. Patent 4340306 (1982).

P. Beckmann and A. Spizzichino, The Scattering of Electromagnetic Waves from Rough Surfaces (Artech House, 1987).

J. L. Beverage, R. V. Shack, and M. R. Descour, “Measurement of the three-dimensional microscope point spread function using a Shack-Hartmann wavefront sensor,” J. Microsc. 205(1), 61–75 (2002).

[Crossref]
[PubMed]

J. G. McNally, T. Karpova, J. Cooper, and J. A. Conchello, “Three-dimensional imaging by deconvolution microscopy,” Methods 19(3), 373–385 (1999).

[Crossref]
[PubMed]

J. G. McNally, T. Karpova, J. Cooper, and J. A. Conchello, “Three-dimensional imaging by deconvolution microscopy,” Methods 19(3), 373–385 (1999).

[Crossref]
[PubMed]

R. Mandal, J. Coupland, R. Leach, and D. Mansfield, “Coherence scanning interferometry: measurement and correction of three-dimensional transfer and point-spread characteristics,” Appl. Opt. 53(8), 1554–1563 (2014).

[Crossref]
[PubMed]

J. Coupland, R. Mandal, K. Palodhi, and R. Leach, “Coherence scanning interferometry: linear theory of surface measurement,” Appl. Opt. 52(16), 3662–3670 (2013).

[Crossref]
[PubMed]

R. Mandal, K. Palodhi, J. Coupland, R. Leach, and D. Mansfield, “Application of linear systems theory to characterize coherence scanning interferometry,” Proc. SPIE 8430, 84300T (2012).

M. R. Foreman, C. L. Giusca, J. M. Coupland, P. Török, and R. K. Leach, “Determination of the transfer function for optical surface topography measuring instruments - a review,” Meas. Sci. Technol. 24(5), 052001 (2013).

[Crossref]

J. M. Coupland and J. Lobera, “Holography, tomography and 3D microscopy as linear filtering operations,” Meas. Sci. Technol. 19(7), 074012 (2008).

[Crossref]

J. M. Coupland, School of Mechanical and Manufacturing Engineering, Loughborough University, Leicestershire, LE11 3TU. (personal communication2014)

P. de Groot and L. Deck, “Surface profiling by analysis of white-light interferograms in the spatial frequency domain,” J. Mod. Opt. 42(2), 389–401 (1995).

[Crossref]

P. de Groot and L. Deck, “Surface profiling by analysis of white-light interferograms in the spatial frequency domain,” J. Mod. Opt. 42(2), 389–401 (1995).

[Crossref]

J. L. Beverage, R. V. Shack, and M. R. Descour, “Measurement of the three-dimensional microscope point spread function using a Shack-Hartmann wavefront sensor,” J. Microsc. 205(1), 61–75 (2002).

[Crossref]
[PubMed]

M. R. Foreman, C. L. Giusca, J. M. Coupland, P. Török, and R. K. Leach, “Determination of the transfer function for optical surface topography measuring instruments - a review,” Meas. Sci. Technol. 24(5), 052001 (2013).

[Crossref]

M. R. Foreman, C. L. Giusca, J. M. Coupland, P. Török, and R. K. Leach, “Determination of the transfer function for optical surface topography measuring instruments - a review,” Meas. Sci. Technol. 24(5), 052001 (2013).

[Crossref]

I.S. Gradshteyn and I.M. Ryzhik, Table of Integrals, Series and Products, 2nd Revised edition (Academic Press, 1980).

J. G. McNally, T. Karpova, J. Cooper, and J. A. Conchello, “Three-dimensional imaging by deconvolution microscopy,” Methods 19(3), 373–385 (1999).

[Crossref]
[PubMed]

R. Mandal, J. Coupland, R. Leach, and D. Mansfield, “Coherence scanning interferometry: measurement and correction of three-dimensional transfer and point-spread characteristics,” Appl. Opt. 53(8), 1554–1563 (2014).

[Crossref]
[PubMed]

J. Coupland, R. Mandal, K. Palodhi, and R. Leach, “Coherence scanning interferometry: linear theory of surface measurement,” Appl. Opt. 52(16), 3662–3670 (2013).

[Crossref]
[PubMed]

R. Mandal, K. Palodhi, J. Coupland, R. Leach, and D. Mansfield, “Application of linear systems theory to characterize coherence scanning interferometry,” Proc. SPIE 8430, 84300T (2012).

M. R. Foreman, C. L. Giusca, J. M. Coupland, P. Török, and R. K. Leach, “Determination of the transfer function for optical surface topography measuring instruments - a review,” Meas. Sci. Technol. 24(5), 052001 (2013).

[Crossref]

J. M. Coupland and J. Lobera, “Holography, tomography and 3D microscopy as linear filtering operations,” Meas. Sci. Technol. 19(7), 074012 (2008).

[Crossref]

R. Mandal, J. Coupland, R. Leach, and D. Mansfield, “Coherence scanning interferometry: measurement and correction of three-dimensional transfer and point-spread characteristics,” Appl. Opt. 53(8), 1554–1563 (2014).

[Crossref]
[PubMed]

J. Coupland, R. Mandal, K. Palodhi, and R. Leach, “Coherence scanning interferometry: linear theory of surface measurement,” Appl. Opt. 52(16), 3662–3670 (2013).

[Crossref]
[PubMed]

R. Mandal, K. Palodhi, J. Coupland, R. Leach, and D. Mansfield, “Application of linear systems theory to characterize coherence scanning interferometry,” Proc. SPIE 8430, 84300T (2012).

R. Mandal, J. Coupland, R. Leach, and D. Mansfield, “Coherence scanning interferometry: measurement and correction of three-dimensional transfer and point-spread characteristics,” Appl. Opt. 53(8), 1554–1563 (2014).

[Crossref]
[PubMed]

R. Mandal, K. Palodhi, J. Coupland, R. Leach, and D. Mansfield, “Application of linear systems theory to characterize coherence scanning interferometry,” Proc. SPIE 8430, 84300T (2012).

J. G. McNally, T. Karpova, J. Cooper, and J. A. Conchello, “Three-dimensional imaging by deconvolution microscopy,” Methods 19(3), 373–385 (1999).

[Crossref]
[PubMed]

P. Sarder and A. Nehorai, “Deconvolution methods for 3-D fluorescence microscopy images,” IEEE Signal Process. Mag. 23(3), 32–45 (2006).

[Crossref]

L. Onural, “Impulse functions over curves and surfaces and their applications to diffraction,” J. Math. Anal. Appl. 322, 18–27 (2006).

[Crossref]

J. Coupland, R. Mandal, K. Palodhi, and R. Leach, “Coherence scanning interferometry: linear theory of surface measurement,” Appl. Opt. 52(16), 3662–3670 (2013).

[Crossref]
[PubMed]

R. Mandal, K. Palodhi, J. Coupland, R. Leach, and D. Mansfield, “Application of linear systems theory to characterize coherence scanning interferometry,” Proc. SPIE 8430, 84300T (2012).

I.S. Gradshteyn and I.M. Ryzhik, Table of Integrals, Series and Products, 2nd Revised edition (Academic Press, 1980).

P. Sarder and A. Nehorai, “Deconvolution methods for 3-D fluorescence microscopy images,” IEEE Signal Process. Mag. 23(3), 32–45 (2006).

[Crossref]

W. Wallace, L. H. Schaefer, and J. R. Swedlow, “A working person’s guide to deconvolution in light microscopy,” Biotechniques 31(5), 1076–1097 (2001).

[PubMed]

J. L. Beverage, R. V. Shack, and M. R. Descour, “Measurement of the three-dimensional microscope point spread function using a Shack-Hartmann wavefront sensor,” J. Microsc. 205(1), 61–75 (2002).

[Crossref]
[PubMed]

P. Beckmann and A. Spizzichino, The Scattering of Electromagnetic Waves from Rough Surfaces (Artech House, 1987).

W. Wallace, L. H. Schaefer, and J. R. Swedlow, “A working person’s guide to deconvolution in light microscopy,” Biotechniques 31(5), 1076–1097 (2001).

[PubMed]

M. R. Foreman, C. L. Giusca, J. M. Coupland, P. Török, and R. K. Leach, “Determination of the transfer function for optical surface topography measuring instruments - a review,” Meas. Sci. Technol. 24(5), 052001 (2013).

[Crossref]

W. Wallace, L. H. Schaefer, and J. R. Swedlow, “A working person’s guide to deconvolution in light microscopy,” Biotechniques 31(5), 1076–1097 (2001).

[PubMed]

G. S. Kino and S. S. C. Chim, “Mirau correlation microscope,” Appl. Opt. 29(26), 3775–3783 (1990).

[Crossref]
[PubMed]

B. S. Lee and T. C. Strand, “Profilometry with a coherence scanning microscope,” Appl. Opt. 29(26), 3784–3788 (1990).

[Crossref]
[PubMed]

J. Coupland, R. Mandal, K. Palodhi, and R. Leach, “Coherence scanning interferometry: linear theory of surface measurement,” Appl. Opt. 52(16), 3662–3670 (2013).

[Crossref]
[PubMed]

R. Mandal, J. Coupland, R. Leach, and D. Mansfield, “Coherence scanning interferometry: measurement and correction of three-dimensional transfer and point-spread characteristics,” Appl. Opt. 53(8), 1554–1563 (2014).

[Crossref]
[PubMed]

W. Wallace, L. H. Schaefer, and J. R. Swedlow, “A working person’s guide to deconvolution in light microscopy,” Biotechniques 31(5), 1076–1097 (2001).

[PubMed]

P. Sarder and A. Nehorai, “Deconvolution methods for 3-D fluorescence microscopy images,” IEEE Signal Process. Mag. 23(3), 32–45 (2006).

[Crossref]

L. Onural, “Impulse functions over curves and surfaces and their applications to diffraction,” J. Math. Anal. Appl. 322, 18–27 (2006).

[Crossref]

J. L. Beverage, R. V. Shack, and M. R. Descour, “Measurement of the three-dimensional microscope point spread function using a Shack-Hartmann wavefront sensor,” J. Microsc. 205(1), 61–75 (2002).

[Crossref]
[PubMed]

P. de Groot and L. Deck, “Surface profiling by analysis of white-light interferograms in the spatial frequency domain,” J. Mod. Opt. 42(2), 389–401 (1995).

[Crossref]

M. R. Foreman, C. L. Giusca, J. M. Coupland, P. Török, and R. K. Leach, “Determination of the transfer function for optical surface topography measuring instruments - a review,” Meas. Sci. Technol. 24(5), 052001 (2013).

[Crossref]

J. M. Coupland and J. Lobera, “Holography, tomography and 3D microscopy as linear filtering operations,” Meas. Sci. Technol. 19(7), 074012 (2008).

[Crossref]

J. G. McNally, T. Karpova, J. Cooper, and J. A. Conchello, “Three-dimensional imaging by deconvolution microscopy,” Methods 19(3), 373–385 (1999).

[Crossref]
[PubMed]

R. Mandal, K. Palodhi, J. Coupland, R. Leach, and D. Mansfield, “Application of linear systems theory to characterize coherence scanning interferometry,” Proc. SPIE 8430, 84300T (2012).

J. M. Coupland, School of Mechanical and Manufacturing Engineering, Loughborough University, Leicestershire, LE11 3TU. (personal communication2014)

N. Balasubramanian, “Optical system for surface topography measurement,” U.S. Patent 4340306 (1982).

P. Beckmann and A. Spizzichino, The Scattering of Electromagnetic Waves from Rough Surfaces (Artech House, 1987).

I.S. Gradshteyn and I.M. Ryzhik, Table of Integrals, Series and Products, 2nd Revised edition (Academic Press, 1980).