M. Kokhharov, S. A. Bakhromov, U. K. Makhmanov, R. A. Kokhkharov, and E. A. Zakhidov, “Self-induced polarization rotation of laser beam in fullerene (C70) solutions,” Opt. Commun. 285(12), 2947–2951 (2012).

[Crossref]

Z. B. Liu, S. Shi, X. Q. Yan, W. Y. Zhou, and J. G. Tian, “Discriminating thermal effect in nonlinear-ellipse-rotation-modified Z-scan measurements,” Opt. Lett. 36(11), 2086–2088 (2011).

[Crossref]
[PubMed]

X. Q. Yan, X. L. Zhang, S. Shi, Z. B. Liu, and J. G. Tian, “Third-order nonlinear susceptibility tensor elements of CS2 at femtosecond time scale,” Opt. Express 19(6), 5559–5564 (2011).

[Crossref]
[PubMed]

Z. B. Liu, X. Q. Yan, J. G. Tian, W. Y. Zhou, and W. P. Zang, “Nonlinear ellipse rotation modified Z-scan measurements of third-order nonlinear susceptibility tensor,” Opt. Express 15(20), 13351–13359 (2007).

[Crossref]
[PubMed]

I. Guedes, L. Misoguti, L. De Boni, and S. C. Zilio, “Heterodyne Z-scan measurements of slow absorbers,” J. Appl. Phys. 101(6), 063112 (2007).

[Crossref]

M. Sheik-Bahae, A. A. Said, T. Wei, D. J. Hagan, and E. W. Van Stryland, “Sensitive measurement of optical nonlinearities using a single beam,” IEEE J. Quantum Electron. 26(4), 760–769 (1990).

[Crossref]

A. Owyoung, “Ellipse rotation studies in laser host materials,” IEEE J. Quantum Electron. 9(11), 1064–1069 (1973).

[Crossref]

P. D. Maker and R. W. Terhune, “Study of optical effects due to an induced polarization third order in the electric field strength,” Phys. Rev. 137(3A), A801–A818 (1965).

[Crossref]

P. B. Maker, R. W. Terhune, and C. M. Savage, “Intensity-dependence change in the refractive index of liquids,” Phys. Rev. Lett. 12(18), 507–509 (1964).

[Crossref]

M. Kokhharov, S. A. Bakhromov, U. K. Makhmanov, R. A. Kokhkharov, and E. A. Zakhidov, “Self-induced polarization rotation of laser beam in fullerene (C70) solutions,” Opt. Commun. 285(12), 2947–2951 (2012).

[Crossref]

S. Hughes and J. M. Burzler, “Theory of Z-scan measurements using Gaussian-Bessel beams,” Phys. Rev. A 56(2), R1103–R1106 (1997).

[Crossref]

I. Guedes, L. Misoguti, L. De Boni, and S. C. Zilio, “Heterodyne Z-scan measurements of slow absorbers,” J. Appl. Phys. 101(6), 063112 (2007).

[Crossref]

I. Guedes, L. Misoguti, L. De Boni, and S. C. Zilio, “Heterodyne Z-scan measurements of slow absorbers,” J. Appl. Phys. 101(6), 063112 (2007).

[Crossref]

M. Sheik-Bahae, A. A. Said, T. Wei, D. J. Hagan, and E. W. Van Stryland, “Sensitive measurement of optical nonlinearities using a single beam,” IEEE J. Quantum Electron. 26(4), 760–769 (1990).

[Crossref]

S. Hughes and J. M. Burzler, “Theory of Z-scan measurements using Gaussian-Bessel beams,” Phys. Rev. A 56(2), R1103–R1106 (1997).

[Crossref]

M. Kokhharov, S. A. Bakhromov, U. K. Makhmanov, R. A. Kokhkharov, and E. A. Zakhidov, “Self-induced polarization rotation of laser beam in fullerene (C70) solutions,” Opt. Commun. 285(12), 2947–2951 (2012).

[Crossref]

M. Kokhharov, S. A. Bakhromov, U. K. Makhmanov, R. A. Kokhkharov, and E. A. Zakhidov, “Self-induced polarization rotation of laser beam in fullerene (C70) solutions,” Opt. Commun. 285(12), 2947–2951 (2012).

[Crossref]

X. Q. Yan, X. L. Zhang, S. Shi, Z. B. Liu, and J. G. Tian, “Third-order nonlinear susceptibility tensor elements of CS2 at femtosecond time scale,” Opt. Express 19(6), 5559–5564 (2011).

[Crossref]
[PubMed]

Z. B. Liu, S. Shi, X. Q. Yan, W. Y. Zhou, and J. G. Tian, “Discriminating thermal effect in nonlinear-ellipse-rotation-modified Z-scan measurements,” Opt. Lett. 36(11), 2086–2088 (2011).

[Crossref]
[PubMed]

X. Q. Yan, Z. B. Liu, X. L. Zhang, W. Y. Zhou, and J. G. Tian, “Polarization dependence of Z-scan measurement: theory and experiment,” Opt. Express 17(8), 6397–6406 (2009).

[Crossref]
[PubMed]

Z. B. Liu, X. Q. Yan, J. G. Tian, W. Y. Zhou, and W. P. Zang, “Nonlinear ellipse rotation modified Z-scan measurements of third-order nonlinear susceptibility tensor,” Opt. Express 15(20), 13351–13359 (2007).

[Crossref]
[PubMed]

P. B. Maker, R. W. Terhune, and C. M. Savage, “Intensity-dependence change in the refractive index of liquids,” Phys. Rev. Lett. 12(18), 507–509 (1964).

[Crossref]

P. D. Maker and R. W. Terhune, “Study of optical effects due to an induced polarization third order in the electric field strength,” Phys. Rev. 137(3A), A801–A818 (1965).

[Crossref]

M. Kokhharov, S. A. Bakhromov, U. K. Makhmanov, R. A. Kokhkharov, and E. A. Zakhidov, “Self-induced polarization rotation of laser beam in fullerene (C70) solutions,” Opt. Commun. 285(12), 2947–2951 (2012).

[Crossref]

E. C. Barbano, S. C. Zílio, and L. Misoguti, “Influence of self-focusing of ultrashort laser pulses on optical third-harmonic generation at interfaces,” Opt. Lett. 38(23), 5165–5168 (2013).

[Crossref]
[PubMed]

I. Guedes, L. Misoguti, L. De Boni, and S. C. Zilio, “Heterodyne Z-scan measurements of slow absorbers,” J. Appl. Phys. 101(6), 063112 (2007).

[Crossref]

A. Owyoung, “Ellipse rotation studies in laser host materials,” IEEE J. Quantum Electron. 9(11), 1064–1069 (1973).

[Crossref]

M. Sheik-Bahae, A. A. Said, T. Wei, D. J. Hagan, and E. W. Van Stryland, “Sensitive measurement of optical nonlinearities using a single beam,” IEEE J. Quantum Electron. 26(4), 760–769 (1990).

[Crossref]

P. B. Maker, R. W. Terhune, and C. M. Savage, “Intensity-dependence change in the refractive index of liquids,” Phys. Rev. Lett. 12(18), 507–509 (1964).

[Crossref]

M. Sheik-Bahae, A. A. Said, T. Wei, D. J. Hagan, and E. W. Van Stryland, “Sensitive measurement of optical nonlinearities using a single beam,” IEEE J. Quantum Electron. 26(4), 760–769 (1990).

[Crossref]

Z. B. Liu, S. Shi, X. Q. Yan, W. Y. Zhou, and J. G. Tian, “Discriminating thermal effect in nonlinear-ellipse-rotation-modified Z-scan measurements,” Opt. Lett. 36(11), 2086–2088 (2011).

[Crossref]
[PubMed]

X. Q. Yan, X. L. Zhang, S. Shi, Z. B. Liu, and J. G. Tian, “Third-order nonlinear susceptibility tensor elements of CS2 at femtosecond time scale,” Opt. Express 19(6), 5559–5564 (2011).

[Crossref]
[PubMed]

P. D. Maker and R. W. Terhune, “Study of optical effects due to an induced polarization third order in the electric field strength,” Phys. Rev. 137(3A), A801–A818 (1965).

[Crossref]

P. B. Maker, R. W. Terhune, and C. M. Savage, “Intensity-dependence change in the refractive index of liquids,” Phys. Rev. Lett. 12(18), 507–509 (1964).

[Crossref]

Z. B. Liu, S. Shi, X. Q. Yan, W. Y. Zhou, and J. G. Tian, “Discriminating thermal effect in nonlinear-ellipse-rotation-modified Z-scan measurements,” Opt. Lett. 36(11), 2086–2088 (2011).

[Crossref]
[PubMed]

X. Q. Yan, X. L. Zhang, S. Shi, Z. B. Liu, and J. G. Tian, “Third-order nonlinear susceptibility tensor elements of CS2 at femtosecond time scale,” Opt. Express 19(6), 5559–5564 (2011).

[Crossref]
[PubMed]

X. Q. Yan, Z. B. Liu, X. L. Zhang, W. Y. Zhou, and J. G. Tian, “Polarization dependence of Z-scan measurement: theory and experiment,” Opt. Express 17(8), 6397–6406 (2009).

[Crossref]
[PubMed]

Z. B. Liu, X. Q. Yan, J. G. Tian, W. Y. Zhou, and W. P. Zang, “Nonlinear ellipse rotation modified Z-scan measurements of third-order nonlinear susceptibility tensor,” Opt. Express 15(20), 13351–13359 (2007).

[Crossref]
[PubMed]

M. Sheik-Bahae, A. A. Said, T. Wei, D. J. Hagan, and E. W. Van Stryland, “Sensitive measurement of optical nonlinearities using a single beam,” IEEE J. Quantum Electron. 26(4), 760–769 (1990).

[Crossref]

M. Sheik-Bahae, A. A. Said, T. Wei, D. J. Hagan, and E. W. Van Stryland, “Sensitive measurement of optical nonlinearities using a single beam,” IEEE J. Quantum Electron. 26(4), 760–769 (1990).

[Crossref]

X. Q. Yan, X. L. Zhang, S. Shi, Z. B. Liu, and J. G. Tian, “Third-order nonlinear susceptibility tensor elements of CS2 at femtosecond time scale,” Opt. Express 19(6), 5559–5564 (2011).

[Crossref]
[PubMed]

Z. B. Liu, S. Shi, X. Q. Yan, W. Y. Zhou, and J. G. Tian, “Discriminating thermal effect in nonlinear-ellipse-rotation-modified Z-scan measurements,” Opt. Lett. 36(11), 2086–2088 (2011).

[Crossref]
[PubMed]

X. Q. Yan, Z. B. Liu, X. L. Zhang, W. Y. Zhou, and J. G. Tian, “Polarization dependence of Z-scan measurement: theory and experiment,” Opt. Express 17(8), 6397–6406 (2009).

[Crossref]
[PubMed]

Z. B. Liu, X. Q. Yan, J. G. Tian, W. Y. Zhou, and W. P. Zang, “Nonlinear ellipse rotation modified Z-scan measurements of third-order nonlinear susceptibility tensor,” Opt. Express 15(20), 13351–13359 (2007).

[Crossref]
[PubMed]

M. Kokhharov, S. A. Bakhromov, U. K. Makhmanov, R. A. Kokhkharov, and E. A. Zakhidov, “Self-induced polarization rotation of laser beam in fullerene (C70) solutions,” Opt. Commun. 285(12), 2947–2951 (2012).

[Crossref]

X. Q. Yan, X. L. Zhang, S. Shi, Z. B. Liu, and J. G. Tian, “Third-order nonlinear susceptibility tensor elements of CS2 at femtosecond time scale,” Opt. Express 19(6), 5559–5564 (2011).

[Crossref]
[PubMed]

X. Q. Yan, Z. B. Liu, X. L. Zhang, W. Y. Zhou, and J. G. Tian, “Polarization dependence of Z-scan measurement: theory and experiment,” Opt. Express 17(8), 6397–6406 (2009).

[Crossref]
[PubMed]

Z. B. Liu, S. Shi, X. Q. Yan, W. Y. Zhou, and J. G. Tian, “Discriminating thermal effect in nonlinear-ellipse-rotation-modified Z-scan measurements,” Opt. Lett. 36(11), 2086–2088 (2011).

[Crossref]
[PubMed]

X. Q. Yan, Z. B. Liu, X. L. Zhang, W. Y. Zhou, and J. G. Tian, “Polarization dependence of Z-scan measurement: theory and experiment,” Opt. Express 17(8), 6397–6406 (2009).

[Crossref]
[PubMed]

Z. B. Liu, X. Q. Yan, J. G. Tian, W. Y. Zhou, and W. P. Zang, “Nonlinear ellipse rotation modified Z-scan measurements of third-order nonlinear susceptibility tensor,” Opt. Express 15(20), 13351–13359 (2007).

[Crossref]
[PubMed]

I. Guedes, L. Misoguti, L. De Boni, and S. C. Zilio, “Heterodyne Z-scan measurements of slow absorbers,” J. Appl. Phys. 101(6), 063112 (2007).

[Crossref]

M. Sheik-Bahae, A. A. Said, T. Wei, D. J. Hagan, and E. W. Van Stryland, “Sensitive measurement of optical nonlinearities using a single beam,” IEEE J. Quantum Electron. 26(4), 760–769 (1990).

[Crossref]

A. Owyoung, “Ellipse rotation studies in laser host materials,” IEEE J. Quantum Electron. 9(11), 1064–1069 (1973).

[Crossref]

I. Guedes, L. Misoguti, L. De Boni, and S. C. Zilio, “Heterodyne Z-scan measurements of slow absorbers,” J. Appl. Phys. 101(6), 063112 (2007).

[Crossref]

N. Minkovscki, G. I. Petrov, S. M. Satiel, O. Albert, and J. Etchepare, “Nonlinear polarization rotation and orthogonal polarization generation experienced in a single-beam configuration,” J. Opt. Soc. Am. B 21(9), 1659–1664 (2004).

[Crossref]

R. Adair, L. L. Chase, and S. A. Payne, “Nonlinear refractive-index measurements of glasses using three-wave frequency mixing,” J. Opt. Soc. Am. B 4(6), 875–881 (1987).

[Crossref]

M. Lefkir and G. Rivoire, “Influence of transverse effect on measurement of third-order nonlinear susceptibility by self-induced polarization state change,” J. Opt. Soc. Am. B 14(11), 2856–2864 (1997).

[Crossref]

M. Kokhharov, S. A. Bakhromov, U. K. Makhmanov, R. A. Kokhkharov, and E. A. Zakhidov, “Self-induced polarization rotation of laser beam in fullerene (C70) solutions,” Opt. Commun. 285(12), 2947–2951 (2012).

[Crossref]

Z. B. Liu, X. Q. Yan, J. G. Tian, W. Y. Zhou, and W. P. Zang, “Nonlinear ellipse rotation modified Z-scan measurements of third-order nonlinear susceptibility tensor,” Opt. Express 15(20), 13351–13359 (2007).

[Crossref]
[PubMed]

X. Q. Yan, Z. B. Liu, X. L. Zhang, W. Y. Zhou, and J. G. Tian, “Polarization dependence of Z-scan measurement: theory and experiment,” Opt. Express 17(8), 6397–6406 (2009).

[Crossref]
[PubMed]

X. Q. Yan, X. L. Zhang, S. Shi, Z. B. Liu, and J. G. Tian, “Third-order nonlinear susceptibility tensor elements of CS2 at femtosecond time scale,” Opt. Express 19(6), 5559–5564 (2011).

[Crossref]
[PubMed]

E. C. Barbano, S. C. Zílio, and L. Misoguti, “Influence of self-focusing of ultrashort laser pulses on optical third-harmonic generation at interfaces,” Opt. Lett. 38(23), 5165–5168 (2013).

[Crossref]
[PubMed]

Z. B. Liu, S. Shi, X. Q. Yan, W. Y. Zhou, and J. G. Tian, “Discriminating thermal effect in nonlinear-ellipse-rotation-modified Z-scan measurements,” Opt. Lett. 36(11), 2086–2088 (2011).

[Crossref]
[PubMed]

P. D. Maker and R. W. Terhune, “Study of optical effects due to an induced polarization third order in the electric field strength,” Phys. Rev. 137(3A), A801–A818 (1965).

[Crossref]

S. Hughes and J. M. Burzler, “Theory of Z-scan measurements using Gaussian-Bessel beams,” Phys. Rev. A 56(2), R1103–R1106 (1997).

[Crossref]

P. B. Maker, R. W. Terhune, and C. M. Savage, “Intensity-dependence change in the refractive index of liquids,” Phys. Rev. Lett. 12(18), 507–509 (1964).

[Crossref]

M. L. Miguez, E. C. Barbano, S. C. Zilio, L. Misoguti, and K. L. Vodopyanov, “New simple method for measuring nonlinear polarization ellipse rotation with high precision using a dual-phase lock-in,” in Nonlinear Frequency Generation and Conversion: Materials, Devices and Applications XIII, edited by Konstantin L. Vodopyanov, Proceedings of SPIE Vol. 8964 (SPIE, Bellingham, WA, 2014) 896446.

R. W. Boyd, Nonlinear Optics, 3rd edition (Academic, 2008).