Abstract

A stable Eu3+→Eu2+ reduction is accomplished by thermal annealing in N2 ambient of Eu2O3 films deposited by magnetron sputtering on Si substrates. Transmission electron microscopy and x-ray diffraction measurements demonstrate the occurrence of a complex reactivity at the Eu2O3/Si interface, leading to the formation of Eu2+ silicates, characterized by a very strong (the measured external quantum efficiency is about 10%) and broad room temperature photoluminescence (PL) peak centered at 590 nm. This signal is much more efficient than the Eu3+ emission, mainly consisting of a sharp PL peak at 622 nm, observed in O2-annealed films, where the presence of a SiO2 layer at the Eu2O3/Si interface prevents Eu2+ formation.

©2012 Optical Society of America

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    [Crossref] [PubMed]
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    [Crossref]
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    [Crossref]
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    [Crossref]
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  22. Y. Qiao, D. Chen, J. Ren, B. Wu, J. Qiu, and T. Akai, “Blue emission from Eu2+-doped high silica glass by near-infrared femtosecond laser irradiation,” J. Appl. Phys. 103(2), 023108 (2008).
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2011 (1)

2010 (4)

2009 (2)

X. Ye, W. Zhuang, Y. Hu, T. He, X. Huang, C. Liao, S. Zhong, Z. Xu, H. Nie, and G. Deng, “Preparation, characterization, and optical properties of nano- and submicron-sized Y2O3:Eu3+ phosphors,” J. Appl. Phys. 105(6), 064302 (2009).
[Crossref]

Y. C. Shin, S. J. Leem, C. M. Kim, S. J. Kim, Y. M. Sung, C. K. Hahn, J. H. Baek, and T. G. Kim, “Deposition of Europium Oxide on Si and its optical properties depending on thermal annealing conditions,” J. Electroceram. 23(2-4), 326–330 (2009).
[Crossref]

2008 (2)

L. Rebohle, J. Lehmann, S. Prucnal, A. Kanjilal, A. Nazarov, I. Tyagulskii, W. Skorupa, and M. Helm, “Blue and red electroluminescence of Europium-implanted metal-oxide-semiconductor structures as a probe for the dynamics of microstructure,” Appl. Phys. Lett. 93(7), 071908 (2008).
[Crossref]

Y. Qiao, D. Chen, J. Ren, B. Wu, J. Qiu, and T. Akai, “Blue emission from Eu2+-doped high silica glass by near-infrared femtosecond laser irradiation,” J. Appl. Phys. 103(2), 023108 (2008).
[Crossref]

2007 (2)

S. Prucnal, J. M. Sun, W. Skorupa, and M. Helm, “Switchable two-color electroluminescence based on a Si metal-oxide-semiconductor structure doped with Eu,” Appl. Phys. Lett. 90(18), 181121 (2007).
[Crossref]

M. Miritello, R. Lo Savio, F. Iacona, G. Franzò, A. Irrera, A. M. Piro, C. Bongiorno, and F. Priolo, “Efficient luminescence and energy transfer in Erbium Silicate thin films,” Adv. Mater. (Deerfield Beach Fla.) 19(12), 1582–1588 (2007).
[Crossref]

2006 (1)

M. Miritello, R. Lo Savio, A. M. Piro, G. Franzò, F. Priolo, F. Iacona, and C. Bongiorno, “Optical and structural properties of Er2O3 films grown by magnetron sputtering,” J. Appl. Phys. 100(1), 013502 (2006).
[Crossref]

2004 (1)

2001 (1)

G. Wakefield, E. Holland, P. J. Dobson, and J. L. Hutchison, “Luminescence properties of nanocrystalline Y2O3:Eu,” Adv. Mater. (Deerfield Beach Fla.) 13(20), 1557–1560 (2001).
[Crossref]

1999 (1)

J. Qi, T. Matsumoto, M. Tanaka, and Y. Masumoto, “Electroluminescence of europium silicate thin film on silicon,” Appl. Phys. Lett. 74(21), 3203–3205 (1999).
[Crossref]

1997 (1)

A. Polman, “Erbium implanted thin film photonic materials,” J. Appl. Phys. 82(1), 366265 (1997).
[Crossref]

1996 (1)

M. Nogami and Y. Abe, “Enhanced emission from Eu2+ ions in sol gel derived Al2O3–SiO2 glasses,” Appl. Phys. Lett. 69(25), 3776–3778 (1996).
[Crossref]

1965 (1)

M. W. Shafer, “Preparation and crystal chemistry of divalent europium compounds,” J. Appl. Phys. 36(3), 1145–1152 (1965).
[Crossref]

Abe, Y.

M. Nogami and Y. Abe, “Enhanced emission from Eu2+ ions in sol gel derived Al2O3–SiO2 glasses,” Appl. Phys. Lett. 69(25), 3776–3778 (1996).
[Crossref]

Akai, T.

Y. Qiao, D. Chen, J. Ren, B. Wu, J. Qiu, and T. Akai, “Blue emission from Eu2+-doped high silica glass by near-infrared femtosecond laser irradiation,” J. Appl. Phys. 103(2), 023108 (2008).
[Crossref]

Baek, J. H.

Y. C. Shin, S. J. Leem, C. M. Kim, S. J. Kim, Y. M. Sung, C. K. Hahn, J. H. Baek, and T. G. Kim, “Deposition of Europium Oxide on Si and its optical properties depending on thermal annealing conditions,” J. Electroceram. 23(2-4), 326–330 (2009).
[Crossref]

Bellocchi, G.

G. Bellocchi, G. Franzò, F. Iacona, S. Boninelli, M. Miritello, and F. Priolo, “Synthesis and characterization of light emitting Eu2O3 films on Si substrates,” J. Lumin. (to be published).

Bongiorno, C.

M. Miritello, R. Lo Savio, F. Iacona, G. Franzò, A. Irrera, A. M. Piro, C. Bongiorno, and F. Priolo, “Efficient luminescence and energy transfer in Erbium Silicate thin films,” Adv. Mater. (Deerfield Beach Fla.) 19(12), 1582–1588 (2007).
[Crossref]

M. Miritello, R. Lo Savio, A. M. Piro, G. Franzò, F. Priolo, F. Iacona, and C. Bongiorno, “Optical and structural properties of Er2O3 films grown by magnetron sputtering,” J. Appl. Phys. 100(1), 013502 (2006).
[Crossref]

Boninelli, S.

G. Bellocchi, G. Franzò, F. Iacona, S. Boninelli, M. Miritello, and F. Priolo, “Synthesis and characterization of light emitting Eu2O3 films on Si substrates,” J. Lumin. (to be published).

Cardile, P.

M. Miritello, P. Cardile, R. Lo Savio, and F. Priolo, “Energy transfer and enhanced 1.54 μm emission in Erbium-Ytterbium disilicate thin films,” Opt. Express 19(21), 20761–20772 (2011).
[Crossref] [PubMed]

M. Miritello, R. Lo Savio, P. Cardile, and F. Priolo, “Enhanced down conversion of photons emitted by photoexcited ErxY2−xSi2O7 films grown on silicon,” Phys. Rev. B 81(4), 041411 (2010).
[Crossref]

Chang, J. S.

Chen, B.

Chen, D.

Y. Qiao, D. Chen, J. Ren, B. Wu, J. Qiu, and T. Akai, “Blue emission from Eu2+-doped high silica glass by near-infrared femtosecond laser irradiation,” J. Appl. Phys. 103(2), 023108 (2008).
[Crossref]

Da, N.

Deng, G.

X. Ye, W. Zhuang, Y. Hu, T. He, X. Huang, C. Liao, S. Zhong, Z. Xu, H. Nie, and G. Deng, “Preparation, characterization, and optical properties of nano- and submicron-sized Y2O3:Eu3+ phosphors,” J. Appl. Phys. 105(6), 064302 (2009).
[Crossref]

Dobson, P. J.

G. Wakefield, E. Holland, P. J. Dobson, and J. L. Hutchison, “Luminescence properties of nanocrystalline Y2O3:Eu,” Adv. Mater. (Deerfield Beach Fla.) 13(20), 1557–1560 (2001).
[Crossref]

Franzò, G.

M. Miritello, R. Lo Savio, F. Iacona, G. Franzò, A. Irrera, A. M. Piro, C. Bongiorno, and F. Priolo, “Efficient luminescence and energy transfer in Erbium Silicate thin films,” Adv. Mater. (Deerfield Beach Fla.) 19(12), 1582–1588 (2007).
[Crossref]

M. Miritello, R. Lo Savio, A. M. Piro, G. Franzò, F. Priolo, F. Iacona, and C. Bongiorno, “Optical and structural properties of Er2O3 films grown by magnetron sputtering,” J. Appl. Phys. 100(1), 013502 (2006).
[Crossref]

G. Bellocchi, G. Franzò, F. Iacona, S. Boninelli, M. Miritello, and F. Priolo, “Synthesis and characterization of light emitting Eu2O3 films on Si substrates,” J. Lumin. (to be published).

Gao, G.

Hahn, C. K.

Y. C. Shin, S. J. Leem, C. M. Kim, S. J. Kim, Y. M. Sung, C. K. Hahn, J. H. Baek, and T. G. Kim, “Deposition of Europium Oxide on Si and its optical properties depending on thermal annealing conditions,” J. Electroceram. 23(2-4), 326–330 (2009).
[Crossref]

He, T.

X. Ye, W. Zhuang, Y. Hu, T. He, X. Huang, C. Liao, S. Zhong, Z. Xu, H. Nie, and G. Deng, “Preparation, characterization, and optical properties of nano- and submicron-sized Y2O3:Eu3+ phosphors,” J. Appl. Phys. 105(6), 064302 (2009).
[Crossref]

Helm, M.

L. Rebohle, J. Lehmann, S. Prucnal, A. Kanjilal, A. Nazarov, I. Tyagulskii, W. Skorupa, and M. Helm, “Blue and red electroluminescence of Europium-implanted metal-oxide-semiconductor structures as a probe for the dynamics of microstructure,” Appl. Phys. Lett. 93(7), 071908 (2008).
[Crossref]

S. Prucnal, J. M. Sun, W. Skorupa, and M. Helm, “Switchable two-color electroluminescence based on a Si metal-oxide-semiconductor structure doped with Eu,” Appl. Phys. Lett. 90(18), 181121 (2007).
[Crossref]

Holland, E.

G. Wakefield, E. Holland, P. J. Dobson, and J. L. Hutchison, “Luminescence properties of nanocrystalline Y2O3:Eu,” Adv. Mater. (Deerfield Beach Fla.) 13(20), 1557–1560 (2001).
[Crossref]

Hu, Y.

X. Ye, W. Zhuang, Y. Hu, T. He, X. Huang, C. Liao, S. Zhong, Z. Xu, H. Nie, and G. Deng, “Preparation, characterization, and optical properties of nano- and submicron-sized Y2O3:Eu3+ phosphors,” J. Appl. Phys. 105(6), 064302 (2009).
[Crossref]

Huang, X.

X. Ye, W. Zhuang, Y. Hu, T. He, X. Huang, C. Liao, S. Zhong, Z. Xu, H. Nie, and G. Deng, “Preparation, characterization, and optical properties of nano- and submicron-sized Y2O3:Eu3+ phosphors,” J. Appl. Phys. 105(6), 064302 (2009).
[Crossref]

Hutchison, J. L.

G. Wakefield, E. Holland, P. J. Dobson, and J. L. Hutchison, “Luminescence properties of nanocrystalline Y2O3:Eu,” Adv. Mater. (Deerfield Beach Fla.) 13(20), 1557–1560 (2001).
[Crossref]

Iacona, F.

M. Miritello, R. Lo Savio, F. Iacona, G. Franzò, A. Irrera, A. M. Piro, C. Bongiorno, and F. Priolo, “Efficient luminescence and energy transfer in Erbium Silicate thin films,” Adv. Mater. (Deerfield Beach Fla.) 19(12), 1582–1588 (2007).
[Crossref]

M. Miritello, R. Lo Savio, A. M. Piro, G. Franzò, F. Priolo, F. Iacona, and C. Bongiorno, “Optical and structural properties of Er2O3 films grown by magnetron sputtering,” J. Appl. Phys. 100(1), 013502 (2006).
[Crossref]

G. Bellocchi, G. Franzò, F. Iacona, S. Boninelli, M. Miritello, and F. Priolo, “Synthesis and characterization of light emitting Eu2O3 films on Si substrates,” J. Lumin. (to be published).

Irrera, A.

M. Miritello, R. Lo Savio, F. Iacona, G. Franzò, A. Irrera, A. M. Piro, C. Bongiorno, and F. Priolo, “Efficient luminescence and energy transfer in Erbium Silicate thin films,” Adv. Mater. (Deerfield Beach Fla.) 19(12), 1582–1588 (2007).
[Crossref]

Jin, L.

Kanjilal, A.

L. Rebohle, J. Lehmann, S. Prucnal, A. Kanjilal, A. Nazarov, I. Tyagulskii, W. Skorupa, and M. Helm, “Blue and red electroluminescence of Europium-implanted metal-oxide-semiconductor structures as a probe for the dynamics of microstructure,” Appl. Phys. Lett. 93(7), 071908 (2008).
[Crossref]

Kim, C. M.

Y. C. Shin, S. J. Leem, C. M. Kim, S. J. Kim, Y. M. Sung, C. K. Hahn, J. H. Baek, and T. G. Kim, “Deposition of Europium Oxide on Si and its optical properties depending on thermal annealing conditions,” J. Electroceram. 23(2-4), 326–330 (2009).
[Crossref]

Kim, S. J.

Y. C. Shin, S. J. Leem, C. M. Kim, S. J. Kim, Y. M. Sung, C. K. Hahn, J. H. Baek, and T. G. Kim, “Deposition of Europium Oxide on Si and its optical properties depending on thermal annealing conditions,” J. Electroceram. 23(2-4), 326–330 (2009).
[Crossref]

Kim, T. G.

Y. C. Shin, S. J. Leem, C. M. Kim, S. J. Kim, Y. M. Sung, C. K. Hahn, J. H. Baek, and T. G. Kim, “Deposition of Europium Oxide on Si and its optical properties depending on thermal annealing conditions,” J. Electroceram. 23(2-4), 326–330 (2009).
[Crossref]

Lee, H.

Lee, M.

Leem, S. J.

Y. C. Shin, S. J. Leem, C. M. Kim, S. J. Kim, Y. M. Sung, C. K. Hahn, J. H. Baek, and T. G. Kim, “Deposition of Europium Oxide on Si and its optical properties depending on thermal annealing conditions,” J. Electroceram. 23(2-4), 326–330 (2009).
[Crossref]

Lehmann, J.

L. Rebohle, J. Lehmann, S. Prucnal, A. Kanjilal, A. Nazarov, I. Tyagulskii, W. Skorupa, and M. Helm, “Blue and red electroluminescence of Europium-implanted metal-oxide-semiconductor structures as a probe for the dynamics of microstructure,” Appl. Phys. Lett. 93(7), 071908 (2008).
[Crossref]

Li, D.

Li, Z. C.

Liang, H.

Liao, C.

X. Ye, W. Zhuang, Y. Hu, T. He, X. Huang, C. Liao, S. Zhong, Z. Xu, H. Nie, and G. Deng, “Preparation, characterization, and optical properties of nano- and submicron-sized Y2O3:Eu3+ phosphors,” J. Appl. Phys. 105(6), 064302 (2009).
[Crossref]

Lo Savio, R.

M. Miritello, P. Cardile, R. Lo Savio, and F. Priolo, “Energy transfer and enhanced 1.54 μm emission in Erbium-Ytterbium disilicate thin films,” Opt. Express 19(21), 20761–20772 (2011).
[Crossref] [PubMed]

M. Miritello, R. Lo Savio, P. Cardile, and F. Priolo, “Enhanced down conversion of photons emitted by photoexcited ErxY2−xSi2O7 films grown on silicon,” Phys. Rev. B 81(4), 041411 (2010).
[Crossref]

M. Miritello, R. Lo Savio, F. Iacona, G. Franzò, A. Irrera, A. M. Piro, C. Bongiorno, and F. Priolo, “Efficient luminescence and energy transfer in Erbium Silicate thin films,” Adv. Mater. (Deerfield Beach Fla.) 19(12), 1582–1588 (2007).
[Crossref]

M. Miritello, R. Lo Savio, A. M. Piro, G. Franzò, F. Priolo, F. Iacona, and C. Bongiorno, “Optical and structural properties of Er2O3 films grown by magnetron sputtering,” J. Appl. Phys. 100(1), 013502 (2006).
[Crossref]

Masumoto, Y.

J. Qi, T. Matsumoto, M. Tanaka, and Y. Masumoto, “Electroluminescence of europium silicate thin film on silicon,” Appl. Phys. Lett. 74(21), 3203–3205 (1999).
[Crossref]

Matsumoto, T.

J. Qi, T. Matsumoto, M. Tanaka, and Y. Masumoto, “Electroluminescence of europium silicate thin film on silicon,” Appl. Phys. Lett. 74(21), 3203–3205 (1999).
[Crossref]

Ming, H.

Miritello, M.

M. Miritello, P. Cardile, R. Lo Savio, and F. Priolo, “Energy transfer and enhanced 1.54 μm emission in Erbium-Ytterbium disilicate thin films,” Opt. Express 19(21), 20761–20772 (2011).
[Crossref] [PubMed]

M. Miritello, R. Lo Savio, P. Cardile, and F. Priolo, “Enhanced down conversion of photons emitted by photoexcited ErxY2−xSi2O7 films grown on silicon,” Phys. Rev. B 81(4), 041411 (2010).
[Crossref]

M. Miritello, R. Lo Savio, F. Iacona, G. Franzò, A. Irrera, A. M. Piro, C. Bongiorno, and F. Priolo, “Efficient luminescence and energy transfer in Erbium Silicate thin films,” Adv. Mater. (Deerfield Beach Fla.) 19(12), 1582–1588 (2007).
[Crossref]

M. Miritello, R. Lo Savio, A. M. Piro, G. Franzò, F. Priolo, F. Iacona, and C. Bongiorno, “Optical and structural properties of Er2O3 films grown by magnetron sputtering,” J. Appl. Phys. 100(1), 013502 (2006).
[Crossref]

G. Bellocchi, G. Franzò, F. Iacona, S. Boninelli, M. Miritello, and F. Priolo, “Synthesis and characterization of light emitting Eu2O3 films on Si substrates,” J. Lumin. (to be published).

Nazarov, A.

L. Rebohle, J. Lehmann, S. Prucnal, A. Kanjilal, A. Nazarov, I. Tyagulskii, W. Skorupa, and M. Helm, “Blue and red electroluminescence of Europium-implanted metal-oxide-semiconductor structures as a probe for the dynamics of microstructure,” Appl. Phys. Lett. 93(7), 071908 (2008).
[Crossref]

Nie, H.

X. Ye, W. Zhuang, Y. Hu, T. He, X. Huang, C. Liao, S. Zhong, Z. Xu, H. Nie, and G. Deng, “Preparation, characterization, and optical properties of nano- and submicron-sized Y2O3:Eu3+ phosphors,” J. Appl. Phys. 105(6), 064302 (2009).
[Crossref]

Nogami, M.

M. Nogami and Y. Abe, “Enhanced emission from Eu2+ ions in sol gel derived Al2O3–SiO2 glasses,” Appl. Phys. Lett. 69(25), 3776–3778 (1996).
[Crossref]

Park, N.

Piro, A. M.

M. Miritello, R. Lo Savio, F. Iacona, G. Franzò, A. Irrera, A. M. Piro, C. Bongiorno, and F. Priolo, “Efficient luminescence and energy transfer in Erbium Silicate thin films,” Adv. Mater. (Deerfield Beach Fla.) 19(12), 1582–1588 (2007).
[Crossref]

M. Miritello, R. Lo Savio, A. M. Piro, G. Franzò, F. Priolo, F. Iacona, and C. Bongiorno, “Optical and structural properties of Er2O3 films grown by magnetron sputtering,” J. Appl. Phys. 100(1), 013502 (2006).
[Crossref]

Polman, A.

A. Polman, “Erbium implanted thin film photonic materials,” J. Appl. Phys. 82(1), 366265 (1997).
[Crossref]

Priolo, F.

M. Miritello, P. Cardile, R. Lo Savio, and F. Priolo, “Energy transfer and enhanced 1.54 μm emission in Erbium-Ytterbium disilicate thin films,” Opt. Express 19(21), 20761–20772 (2011).
[Crossref] [PubMed]

M. Miritello, R. Lo Savio, P. Cardile, and F. Priolo, “Enhanced down conversion of photons emitted by photoexcited ErxY2−xSi2O7 films grown on silicon,” Phys. Rev. B 81(4), 041411 (2010).
[Crossref]

M. Miritello, R. Lo Savio, F. Iacona, G. Franzò, A. Irrera, A. M. Piro, C. Bongiorno, and F. Priolo, “Efficient luminescence and energy transfer in Erbium Silicate thin films,” Adv. Mater. (Deerfield Beach Fla.) 19(12), 1582–1588 (2007).
[Crossref]

M. Miritello, R. Lo Savio, A. M. Piro, G. Franzò, F. Priolo, F. Iacona, and C. Bongiorno, “Optical and structural properties of Er2O3 films grown by magnetron sputtering,” J. Appl. Phys. 100(1), 013502 (2006).
[Crossref]

G. Bellocchi, G. Franzò, F. Iacona, S. Boninelli, M. Miritello, and F. Priolo, “Synthesis and characterization of light emitting Eu2O3 films on Si substrates,” J. Lumin. (to be published).

Prucnal, S.

L. Rebohle, J. Lehmann, S. Prucnal, A. Kanjilal, A. Nazarov, I. Tyagulskii, W. Skorupa, and M. Helm, “Blue and red electroluminescence of Europium-implanted metal-oxide-semiconductor structures as a probe for the dynamics of microstructure,” Appl. Phys. Lett. 93(7), 071908 (2008).
[Crossref]

S. Prucnal, J. M. Sun, W. Skorupa, and M. Helm, “Switchable two-color electroluminescence based on a Si metal-oxide-semiconductor structure doped with Eu,” Appl. Phys. Lett. 90(18), 181121 (2007).
[Crossref]

Qi, J.

J. Qi, T. Matsumoto, M. Tanaka, and Y. Masumoto, “Electroluminescence of europium silicate thin film on silicon,” Appl. Phys. Lett. 74(21), 3203–3205 (1999).
[Crossref]

Qiao, Y.

Y. Qiao, D. Chen, J. Ren, B. Wu, J. Qiu, and T. Akai, “Blue emission from Eu2+-doped high silica glass by near-infrared femtosecond laser irradiation,” J. Appl. Phys. 103(2), 023108 (2008).
[Crossref]

Qiu, J.

Y. Qiao, D. Chen, J. Ren, B. Wu, J. Qiu, and T. Akai, “Blue emission from Eu2+-doped high silica glass by near-infrared femtosecond laser irradiation,” J. Appl. Phys. 103(2), 023108 (2008).
[Crossref]

Rebohle, L.

L. Rebohle, J. Lehmann, S. Prucnal, A. Kanjilal, A. Nazarov, I. Tyagulskii, W. Skorupa, and M. Helm, “Blue and red electroluminescence of Europium-implanted metal-oxide-semiconductor structures as a probe for the dynamics of microstructure,” Appl. Phys. Lett. 93(7), 071908 (2008).
[Crossref]

Reibstein, S.

Ren, J.

Y. Qiao, D. Chen, J. Ren, B. Wu, J. Qiu, and T. Akai, “Blue emission from Eu2+-doped high silica glass by near-infrared femtosecond laser irradiation,” J. Appl. Phys. 103(2), 023108 (2008).
[Crossref]

Shafer, M. W.

M. W. Shafer, “Preparation and crystal chemistry of divalent europium compounds,” J. Appl. Phys. 36(3), 1145–1152 (1965).
[Crossref]

Shin, J. H.

Shin, Y. C.

Y. C. Shin, S. J. Leem, C. M. Kim, S. J. Kim, Y. M. Sung, C. K. Hahn, J. H. Baek, and T. G. Kim, “Deposition of Europium Oxide on Si and its optical properties depending on thermal annealing conditions,” J. Electroceram. 23(2-4), 326–330 (2009).
[Crossref]

Skorupa, W.

L. Rebohle, J. Lehmann, S. Prucnal, A. Kanjilal, A. Nazarov, I. Tyagulskii, W. Skorupa, and M. Helm, “Blue and red electroluminescence of Europium-implanted metal-oxide-semiconductor structures as a probe for the dynamics of microstructure,” Appl. Phys. Lett. 93(7), 071908 (2008).
[Crossref]

S. Prucnal, J. M. Sun, W. Skorupa, and M. Helm, “Switchable two-color electroluminescence based on a Si metal-oxide-semiconductor structure doped with Eu,” Appl. Phys. Lett. 90(18), 181121 (2007).
[Crossref]

Suh, K.

Sun, J. M.

S. Prucnal, J. M. Sun, W. Skorupa, and M. Helm, “Switchable two-color electroluminescence based on a Si metal-oxide-semiconductor structure doped with Eu,” Appl. Phys. Lett. 90(18), 181121 (2007).
[Crossref]

Sung, G. Y.

Sung, Y. M.

Y. C. Shin, S. J. Leem, C. M. Kim, S. J. Kim, Y. M. Sung, C. K. Hahn, J. H. Baek, and T. G. Kim, “Deposition of Europium Oxide on Si and its optical properties depending on thermal annealing conditions,” J. Electroceram. 23(2-4), 326–330 (2009).
[Crossref]

Tanaka, M.

J. Qi, T. Matsumoto, M. Tanaka, and Y. Masumoto, “Electroluminescence of europium silicate thin film on silicon,” Appl. Phys. Lett. 74(21), 3203–3205 (1999).
[Crossref]

Tyagulskii, I.

L. Rebohle, J. Lehmann, S. Prucnal, A. Kanjilal, A. Nazarov, I. Tyagulskii, W. Skorupa, and M. Helm, “Blue and red electroluminescence of Europium-implanted metal-oxide-semiconductor structures as a probe for the dynamics of microstructure,” Appl. Phys. Lett. 93(7), 071908 (2008).
[Crossref]

Wakefield, G.

G. Wakefield, E. Holland, P. J. Dobson, and J. L. Hutchison, “Luminescence properties of nanocrystalline Y2O3:Eu,” Adv. Mater. (Deerfield Beach Fla.) 13(20), 1557–1560 (2001).
[Crossref]

Wondraczek, L.

Wu, B.

Y. Qiao, D. Chen, J. Ren, B. Wu, J. Qiu, and T. Akai, “Blue emission from Eu2+-doped high silica glass by near-infrared femtosecond laser irradiation,” J. Appl. Phys. 103(2), 023108 (2008).
[Crossref]

Xu, J.

Xu, Z.

X. Ye, W. Zhuang, Y. Hu, T. He, X. Huang, C. Liao, S. Zhong, Z. Xu, H. Nie, and G. Deng, “Preparation, characterization, and optical properties of nano- and submicron-sized Y2O3:Eu3+ phosphors,” J. Appl. Phys. 105(6), 064302 (2009).
[Crossref]

Yang, D.

Ye, X.

X. Ye, W. Zhuang, Y. Hu, T. He, X. Huang, C. Liao, S. Zhong, Z. Xu, H. Nie, and G. Deng, “Preparation, characterization, and optical properties of nano- and submicron-sized Y2O3:Eu3+ phosphors,” J. Appl. Phys. 105(6), 064302 (2009).
[Crossref]

Zhang, Q. J.

Zhang, X.

Zhao, H.

Zheng, Z. Q.

Zhong, S.

X. Ye, W. Zhuang, Y. Hu, T. He, X. Huang, C. Liao, S. Zhong, Z. Xu, H. Nie, and G. Deng, “Preparation, characterization, and optical properties of nano- and submicron-sized Y2O3:Eu3+ phosphors,” J. Appl. Phys. 105(6), 064302 (2009).
[Crossref]

Zhuang, W.

X. Ye, W. Zhuang, Y. Hu, T. He, X. Huang, C. Liao, S. Zhong, Z. Xu, H. Nie, and G. Deng, “Preparation, characterization, and optical properties of nano- and submicron-sized Y2O3:Eu3+ phosphors,” J. Appl. Phys. 105(6), 064302 (2009).
[Crossref]

Adv. Mater. (Deerfield Beach Fla.) (2)

M. Miritello, R. Lo Savio, F. Iacona, G. Franzò, A. Irrera, A. M. Piro, C. Bongiorno, and F. Priolo, “Efficient luminescence and energy transfer in Erbium Silicate thin films,” Adv. Mater. (Deerfield Beach Fla.) 19(12), 1582–1588 (2007).
[Crossref]

G. Wakefield, E. Holland, P. J. Dobson, and J. L. Hutchison, “Luminescence properties of nanocrystalline Y2O3:Eu,” Adv. Mater. (Deerfield Beach Fla.) 13(20), 1557–1560 (2001).
[Crossref]

Appl. Phys. Lett. (4)

L. Rebohle, J. Lehmann, S. Prucnal, A. Kanjilal, A. Nazarov, I. Tyagulskii, W. Skorupa, and M. Helm, “Blue and red electroluminescence of Europium-implanted metal-oxide-semiconductor structures as a probe for the dynamics of microstructure,” Appl. Phys. Lett. 93(7), 071908 (2008).
[Crossref]

S. Prucnal, J. M. Sun, W. Skorupa, and M. Helm, “Switchable two-color electroluminescence based on a Si metal-oxide-semiconductor structure doped with Eu,” Appl. Phys. Lett. 90(18), 181121 (2007).
[Crossref]

J. Qi, T. Matsumoto, M. Tanaka, and Y. Masumoto, “Electroluminescence of europium silicate thin film on silicon,” Appl. Phys. Lett. 74(21), 3203–3205 (1999).
[Crossref]

M. Nogami and Y. Abe, “Enhanced emission from Eu2+ ions in sol gel derived Al2O3–SiO2 glasses,” Appl. Phys. Lett. 69(25), 3776–3778 (1996).
[Crossref]

J. Appl. Phys. (5)

Y. Qiao, D. Chen, J. Ren, B. Wu, J. Qiu, and T. Akai, “Blue emission from Eu2+-doped high silica glass by near-infrared femtosecond laser irradiation,” J. Appl. Phys. 103(2), 023108 (2008).
[Crossref]

M. W. Shafer, “Preparation and crystal chemistry of divalent europium compounds,” J. Appl. Phys. 36(3), 1145–1152 (1965).
[Crossref]

M. Miritello, R. Lo Savio, A. M. Piro, G. Franzò, F. Priolo, F. Iacona, and C. Bongiorno, “Optical and structural properties of Er2O3 films grown by magnetron sputtering,” J. Appl. Phys. 100(1), 013502 (2006).
[Crossref]

A. Polman, “Erbium implanted thin film photonic materials,” J. Appl. Phys. 82(1), 366265 (1997).
[Crossref]

X. Ye, W. Zhuang, Y. Hu, T. He, X. Huang, C. Liao, S. Zhong, Z. Xu, H. Nie, and G. Deng, “Preparation, characterization, and optical properties of nano- and submicron-sized Y2O3:Eu3+ phosphors,” J. Appl. Phys. 105(6), 064302 (2009).
[Crossref]

J. Electroceram. (1)

Y. C. Shin, S. J. Leem, C. M. Kim, S. J. Kim, Y. M. Sung, C. K. Hahn, J. H. Baek, and T. G. Kim, “Deposition of Europium Oxide on Si and its optical properties depending on thermal annealing conditions,” J. Electroceram. 23(2-4), 326–330 (2009).
[Crossref]

J. Lumin. (1)

G. Bellocchi, G. Franzò, F. Iacona, S. Boninelli, M. Miritello, and F. Priolo, “Synthesis and characterization of light emitting Eu2O3 films on Si substrates,” J. Lumin. (to be published).

Opt. Express (4)

Opt. Lett. (1)

Phys. Rev. B (1)

M. Miritello, R. Lo Savio, P. Cardile, and F. Priolo, “Enhanced down conversion of photons emitted by photoexcited ErxY2−xSi2O7 films grown on silicon,” Phys. Rev. B 81(4), 041411 (2010).
[Crossref]

Other (5)

O. L. Krivanek, M. K. Kundmann, and X. Bourrat, “Elemental mapping by energy-filtered electron microscopy,” Mater. Res. Soc. Symp. Proc. 332, 341–350 (1994).

JCPDS Card No. 43–1009.

JCPDS Card No. 43–1041.

JCPDS Card No. 22–0286.

JCPDS Card No. 35–0299.

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Figures (5)

Fig. 1
Fig. 1 (Color online) Cross-sectional TEM images of as-deposited and annealed Eu2O3 films. (a) BF image of an as-deposited film; (b) BF image of a film treated at 1000 °C for 30 s in O2; (c) BF image of a film treated at 1000 °C for 30 s in N2; (d) EFTEM maps of Si (on the left), O (in the middle) and Eu (on the right) of a film treated at 1000 °C for 30 s in N2. EFTEM images refer to the same region of the sample. The arrows highlight the correspondence between the A and B sublayers in the TEM image shown in (c) and the regions with a different composition in the EFTEM images in (d).

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Fig. 2
Fig. 2 XRD spectra of Eu2O3 films as-deposited, annealed at 1000 °C for 30 s in O2, annealed at 1000 °C for 30 s in N2 and annealed at 1000 °C for 300 s in N2.

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Fig. 3
Fig. 3 Room temperature PL spectra obtained by exciting with the 325 nm line of a He-Cd laser Eu2O3 films as-deposited and annealed at 1000 °C for 30 s in O2.

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Fig. 4
Fig. 4 Room temperature PL spectra obtained by exciting with the 325 nm line of a He-Cd laser Eu2O3 films annealed at 1000 °C in N2 for times ranging from 1 to 300 s. The inset shows the dependence of the integrated PL intensity on the annealing temperature for processes performed for 30 s in N2.

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Fig. 5
Fig. 5 Room temperature PLE spectra of Eu2O3 films as-deposited and annealed at 1000 °C for 300 s in O2. The spectra were taken by integrating the PL peaks obtained for different excitation wavelengths.

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