A polarized low-coherence interferometry demodulation algorithm by recovering the absolute phase of a selected monochromatic frequency

Junfeng Jiang; Shaohua Wang; Tiegen Liu; Kun Liu; Jinde Yin; Xiange Meng; Yimo Zhang; Shuang Wang; Zunqi Qin; Fan Wu; Dingjie Li

doi:10.1364/OE.20.018117

Abstract

A demodulation algorithm based on absolute phase recovery of a selected monochromatic frequency is proposed for optical fiber Fabry-Perot pressure sensing system. The algorithm uses Fourier transform to get the relative phase and intercept of the unwrapped phase-frequency linear fit curve to identify its interference-order, which are then used to recover the absolute phase. A simplified mathematical model of the polarized low-coherence interference fringes was established to illustrate the principle of the proposed algorithm. Phase unwrapping and the selection of monochromatic frequency were discussed in detail. Pressure measurement experiment was carried out to verify the effectiveness of the proposed algorithm. Results showed that the demodulation precision by our algorithm could reach up to 0.15kPa, which has been improved by 13 times comparing with phase slope based algorithm.

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References

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Publication

K. G. Larkin, “Efficient nonlinear algorithm for envelope detection in white-light interferometry,” J. Opt. Soc. Am. 13(4), 832–843 (1996).
[Crossref]
T. Dresel, G. Häusler, and H. Venzke, “Three-dimensional sensing of rough surfaces by coherence radar,” Appl. Opt. 31(7), 919–925 (1992).
[Crossref] [PubMed]
P. Sandoz, R. Devillers, and A. Plata, “Unambiguous profilometry by fringe-order identification in white-light phase-shifting interferometry,” J. Mod. Opt. 44(3), 519–534 (1997).
[Crossref]
A. Hirabayashi, H. Ogawa, and K. Kitagawa, “Fast surface profiler by white-light interferometry by use of a new algorithm based on sampling theory,” Appl. Opt. 41(23), 4876–4883 (2002).
[Crossref] [PubMed]
L. Vabre, A. Dubois, and A. C. Boccara, “Thermal-light full-field optical coherence tomography,” Opt. Lett. 27(7), 530–532 (2002).
[Crossref] [PubMed]
J. G. Kim, “Absolute temperature measurement using white light interferometry,” J. Opt. Soc. Kor. 4(2), 89–93 (2000).
[Crossref]
L. M. Smith and C. C. Dobson, “Absolute displacement measurements using modulation of the spectrum of white light in a Michelson interferometer,” Appl. Opt. 28(16), 3339–3342 (1989).
[Crossref] [PubMed]
S. H. Kim, S. H. Lee, J. I. Lim, and K. H. Kim, “Absolute refractive index measurement method over a broad wavelength region based on white-light interferometry,” Appl. Opt. 49(5), 910–914 (2010).
[Crossref] [PubMed]
G. S. Kino and S. S. C. Chim, “Miraucorrelation microscope,” Appl. Opt. 29(26), 3775–3783 (1990).
[Crossref] [PubMed]
S. S. C. Chim and G. S. Kino, “Three-dimensional image realization in interference microscopy,” Appl. Opt. 31(14), 2550–2553 (1992).
[Crossref] [PubMed]
P. Sandoz, “Wavelet transform as a processing tool in white-light interferometry,” Opt. Lett. 22(14), 1065–1067 (1997).
[Crossref] [PubMed]
S. Chen, A. W. Palmer, K. T. V. Grattan, and B. T. Meggitt, “Digital signal-processing techniques for electronically scanned optical-fiber white-light interferometry,” Appl. Opt. 31(28), 6003–6010 (1992).
[Crossref] [PubMed]
A. Pf rtner and J. Schwider, “Dispersion error in white-light linnik interferometers and its implications for evaluation procedures,” Appl. Opt. 40(34), 6223–6228 (2001).
[Crossref] [PubMed]
P. de Groot and L. Deck, “Surface profiling by analysis of white-light interferograms in the spatial frequency domain,” J. Mod. Opt. 42(2), 389–401 (1995).
[Crossref]
P. Sandoz, “An algorithm for profilometry by white-light phase-shifting interferometry,” J. Mod. Opt. 43, 1545–1554 (1996).
K. Hibino, B. F. Oreb, D. I. Farrant, and K. G. Larkin, “Phase-shifting algorithms for nonlinear and spatially nonuniform phase shifts,” J. Opt. Soc. Am. A 14(4), 918–930 (1997).
[Crossref]
A. Harasaki, J. Schmit, and J. C. Wyant, “Improved vertical-scanning interferometry,” Appl. Opt. 39(13), 2107–2115 (2000).
[Crossref] [PubMed]
P. de Groot, X. Colonna de Lega, J. Kramer, and M. Turzhitsky, “Determination of fringe order in white-light interference microscopy,” Appl. Opt. 41(22), 4571–4578 (2002).
[Crossref] [PubMed]
S. K. Debnath and M. P. Kothiyal, “Improved optical profiling using the spectral phase in spectrally resolved white-light interferometry,” Appl. Opt. 45(27), 6965–6972 (2006).
[Crossref] [PubMed]
R. Dändliker, E. Zimmermann, and G. Frosio, “Electronically scanned white-light interferometry: a novel noise-resistant signal processing,” Opt. Lett. 17(9), 679–681 (1992).
[Crossref] [PubMed]
S. Timoshenko and S. Woinowsky-Krieger, Theory of Plates and Shells (McGraw-Hill, 1989).

2000 (2)

J. G. Kim, “Absolute temperature measurement using white light interferometry,” J. Opt. Soc. Kor. 4(2), 89–93 (2000).
[Crossref]

A. Harasaki, J. Schmit, and J. C. Wyant, “Improved vertical-scanning interferometry,” Appl. Opt. 39(13), 2107–2115 (2000).
[Crossref] [PubMed]

1997 (3)

K. Hibino, B. F. Oreb, D. I. Farrant, and K. G. Larkin, “Phase-shifting algorithms for nonlinear and spatially nonuniform phase shifts,” J. Opt. Soc. Am. A 14(4), 918–930 (1997).
[Crossref]

P. Sandoz, R. Devillers, and A. Plata, “Unambiguous profilometry by fringe-order identification in white-light phase-shifting interferometry,” J. Mod. Opt. 44(3), 519–534 (1997).
[Crossref]

P. Sandoz, “Wavelet transform as a processing tool in white-light interferometry,” Opt. Lett. 22(14), 1065–1067 (1997).
[Crossref] [PubMed]

1996 (2)

P. Sandoz, “An algorithm for profilometry by white-light phase-shifting interferometry,” J. Mod. Opt. 43, 1545–1554 (1996).

K. G. Larkin, “Efficient nonlinear algorithm for envelope detection in white-light interferometry,” J. Opt. Soc. Am. 13(4), 832–843 (1996).
[Crossref]

1995 (1)

P. de Groot and L. Deck, “Surface profiling by analysis of white-light interferograms in the spatial frequency domain,” J. Mod. Opt. 42(2), 389–401 (1995).
[Crossref]

1992 (4)

S. Chen, A. W. Palmer, K. T. V. Grattan, and B. T. Meggitt, “Digital signal-processing techniques for electronically scanned optical-fiber white-light interferometry,” Appl. Opt. 31(28), 6003–6010 (1992).
[Crossref] [PubMed]

S. S. C. Chim and G. S. Kino, “Three-dimensional image realization in interference microscopy,” Appl. Opt. 31(14), 2550–2553 (1992).
[Crossref] [PubMed]

T. Dresel, G. Häusler, and H. Venzke, “Three-dimensional sensing of rough surfaces by coherence radar,” Appl. Opt. 31(7), 919–925 (1992).
[Crossref] [PubMed]

R. Dändliker, E. Zimmermann, and G. Frosio, “Electronically scanned white-light interferometry: a novel noise-resistant signal processing,” Opt. Lett. 17(9), 679–681 (1992).
[Crossref] [PubMed]

1990 (1)

G. S. Kino and S. S. C. Chim, “Miraucorrelation microscope,” Appl. Opt. 29(26), 3775–3783 (1990).
[Crossref] [PubMed]

1989 (1)

L. M. Smith and C. C. Dobson, “Absolute displacement measurements using modulation of the spectrum of white light in a Michelson interferometer,” Appl. Opt. 28(16), 3339–3342 (1989).
[Crossref] [PubMed]

Boccara, A. C.

L. Vabre, A. Dubois, and A. C. Boccara, “Thermal-light full-field optical coherence tomography,” Opt. Lett. 27(7), 530–532 (2002).
[Crossref] [PubMed]

Chen, S.

S. Chen, A. W. Palmer, K. T. V. Grattan, and B. T. Meggitt, “Digital signal-processing techniques for electronically scanned optical-fiber white-light interferometry,” Appl. Opt. 31(28), 6003–6010 (1992).
[Crossref] [PubMed]

Chim, S. S. C.

S. S. C. Chim and G. S. Kino, “Three-dimensional image realization in interference microscopy,” Appl. Opt. 31(14), 2550–2553 (1992).
[Crossref] [PubMed]

G. S. Kino and S. S. C. Chim, “Miraucorrelation microscope,” Appl. Opt. 29(26), 3775–3783 (1990).
[Crossref] [PubMed]

Colonna de Lega, X.

P. de Groot, X. Colonna de Lega, J. Kramer, and M. Turzhitsky, “Determination of fringe order in white-light interference microscopy,” Appl. Opt. 41(22), 4571–4578 (2002).
[Crossref] [PubMed]

Dändliker, R.

R. Dändliker, E. Zimmermann, and G. Frosio, “Electronically scanned white-light interferometry: a novel noise-resistant signal processing,” Opt. Lett. 17(9), 679–681 (1992).
[Crossref] [PubMed]

de Groot, P.

P. de Groot, X. Colonna de Lega, J. Kramer, and M. Turzhitsky, “Determination of fringe order in white-light interference microscopy,” Appl. Opt. 41(22), 4571–4578 (2002).
[Crossref] [PubMed]

P. de Groot and L. Deck, “Surface profiling by analysis of white-light interferograms in the spatial frequency domain,” J. Mod. Opt. 42(2), 389–401 (1995).
[Crossref]

Debnath, S. K.

S. K. Debnath and M. P. Kothiyal, “Improved optical profiling using the spectral phase in spectrally resolved white-light interferometry,” Appl. Opt. 45(27), 6965–6972 (2006).
[Crossref] [PubMed]

Deck, L.

P. de Groot and L. Deck, “Surface profiling by analysis of white-light interferograms in the spatial frequency domain,” J. Mod. Opt. 42(2), 389–401 (1995).
[Crossref]

Devillers, R.

P. Sandoz, R. Devillers, and A. Plata, “Unambiguous profilometry by fringe-order identification in white-light phase-shifting interferometry,” J. Mod. Opt. 44(3), 519–534 (1997).
[Crossref]

Dobson, C. C.

L. M. Smith and C. C. Dobson, “Absolute displacement measurements using modulation of the spectrum of white light in a Michelson interferometer,” Appl. Opt. 28(16), 3339–3342 (1989).
[Crossref] [PubMed]

Dresel, T.

T. Dresel, G. Häusler, and H. Venzke, “Three-dimensional sensing of rough surfaces by coherence radar,” Appl. Opt. 31(7), 919–925 (1992).
[Crossref] [PubMed]

Dubois, A.

L. Vabre, A. Dubois, and A. C. Boccara, “Thermal-light full-field optical coherence tomography,” Opt. Lett. 27(7), 530–532 (2002).
[Crossref] [PubMed]

Farrant, D. I.

K. Hibino, B. F. Oreb, D. I. Farrant, and K. G. Larkin, “Phase-shifting algorithms for nonlinear and spatially nonuniform phase shifts,” J. Opt. Soc. Am. A 14(4), 918–930 (1997).
[Crossref]

Frosio, G.

R. Dändliker, E. Zimmermann, and G. Frosio, “Electronically scanned white-light interferometry: a novel noise-resistant signal processing,” Opt. Lett. 17(9), 679–681 (1992).
[Crossref] [PubMed]

Grattan, K. T. V.

S. Chen, A. W. Palmer, K. T. V. Grattan, and B. T. Meggitt, “Digital signal-processing techniques for electronically scanned optical-fiber white-light interferometry,” Appl. Opt. 31(28), 6003–6010 (1992).
[Crossref] [PubMed]

Harasaki, A.

A. Harasaki, J. Schmit, and J. C. Wyant, “Improved vertical-scanning interferometry,” Appl. Opt. 39(13), 2107–2115 (2000).
[Crossref] [PubMed]

Häusler, G.

T. Dresel, G. Häusler, and H. Venzke, “Three-dimensional sensing of rough surfaces by coherence radar,” Appl. Opt. 31(7), 919–925 (1992).
[Crossref] [PubMed]

Hibino, K.

K. Hibino, B. F. Oreb, D. I. Farrant, and K. G. Larkin, “Phase-shifting algorithms for nonlinear and spatially nonuniform phase shifts,” J. Opt. Soc. Am. A 14(4), 918–930 (1997).
[Crossref]

Hirabayashi, A.

A. Hirabayashi, H. Ogawa, and K. Kitagawa, “Fast surface profiler by white-light interferometry by use of a new algorithm based on sampling theory,” Appl. Opt. 41(23), 4876–4883 (2002).
[Crossref] [PubMed]

Kim, J. G.

J. G. Kim, “Absolute temperature measurement using white light interferometry,” J. Opt. Soc. Kor. 4(2), 89–93 (2000).
[Crossref]

Kim, K. H.

S. H. Kim, S. H. Lee, J. I. Lim, and K. H. Kim, “Absolute refractive index measurement method over a broad wavelength region based on white-light interferometry,” Appl. Opt. 49(5), 910–914 (2010).
[Crossref] [PubMed]

Kim, S. H.

S. H. Kim, S. H. Lee, J. I. Lim, and K. H. Kim, “Absolute refractive index measurement method over a broad wavelength region based on white-light interferometry,” Appl. Opt. 49(5), 910–914 (2010).
[Crossref] [PubMed]

Kino, G. S.

S. S. C. Chim and G. S. Kino, “Three-dimensional image realization in interference microscopy,” Appl. Opt. 31(14), 2550–2553 (1992).
[Crossref] [PubMed]

G. S. Kino and S. S. C. Chim, “Miraucorrelation microscope,” Appl. Opt. 29(26), 3775–3783 (1990).
[Crossref] [PubMed]

Kitagawa, K.

A. Hirabayashi, H. Ogawa, and K. Kitagawa, “Fast surface profiler by white-light interferometry by use of a new algorithm based on sampling theory,” Appl. Opt. 41(23), 4876–4883 (2002).
[Crossref] [PubMed]

Kothiyal, M. P.

S. K. Debnath and M. P. Kothiyal, “Improved optical profiling using the spectral phase in spectrally resolved white-light interferometry,” Appl. Opt. 45(27), 6965–6972 (2006).
[Crossref] [PubMed]

Kramer, J.

P. de Groot, X. Colonna de Lega, J. Kramer, and M. Turzhitsky, “Determination of fringe order in white-light interference microscopy,” Appl. Opt. 41(22), 4571–4578 (2002).
[Crossref] [PubMed]

Larkin, K. G.

K. Hibino, B. F. Oreb, D. I. Farrant, and K. G. Larkin, “Phase-shifting algorithms for nonlinear and spatially nonuniform phase shifts,” J. Opt. Soc. Am. A 14(4), 918–930 (1997).
[Crossref]

K. G. Larkin, “Efficient nonlinear algorithm for envelope detection in white-light interferometry,” J. Opt. Soc. Am. 13(4), 832–843 (1996).
[Crossref]

Lee, S. H.

S. H. Kim, S. H. Lee, J. I. Lim, and K. H. Kim, “Absolute refractive index measurement method over a broad wavelength region based on white-light interferometry,” Appl. Opt. 49(5), 910–914 (2010).
[Crossref] [PubMed]

Lim, J. I.

S. H. Kim, S. H. Lee, J. I. Lim, and K. H. Kim, “Absolute refractive index measurement method over a broad wavelength region based on white-light interferometry,” Appl. Opt. 49(5), 910–914 (2010).
[Crossref] [PubMed]

Meggitt, B. T.

S. Chen, A. W. Palmer, K. T. V. Grattan, and B. T. Meggitt, “Digital signal-processing techniques for electronically scanned optical-fiber white-light interferometry,” Appl. Opt. 31(28), 6003–6010 (1992).
[Crossref] [PubMed]

Ogawa, H.

A. Hirabayashi, H. Ogawa, and K. Kitagawa, “Fast surface profiler by white-light interferometry by use of a new algorithm based on sampling theory,” Appl. Opt. 41(23), 4876–4883 (2002).
[Crossref] [PubMed]

Oreb, B. F.

K. Hibino, B. F. Oreb, D. I. Farrant, and K. G. Larkin, “Phase-shifting algorithms for nonlinear and spatially nonuniform phase shifts,” J. Opt. Soc. Am. A 14(4), 918–930 (1997).
[Crossref]

Palmer, A. W.

S. Chen, A. W. Palmer, K. T. V. Grattan, and B. T. Meggitt, “Digital signal-processing techniques for electronically scanned optical-fiber white-light interferometry,” Appl. Opt. 31(28), 6003–6010 (1992).
[Crossref] [PubMed]

Pf rtner, A.

A. Pf rtner and J. Schwider, “Dispersion error in white-light linnik interferometers and its implications for evaluation procedures,” Appl. Opt. 40(34), 6223–6228 (2001).
[Crossref] [PubMed]

Plata, A.

P. Sandoz, R. Devillers, and A. Plata, “Unambiguous profilometry by fringe-order identification in white-light phase-shifting interferometry,” J. Mod. Opt. 44(3), 519–534 (1997).
[Crossref]

Sandoz, P.

P. Sandoz, R. Devillers, and A. Plata, “Unambiguous profilometry by fringe-order identification in white-light phase-shifting interferometry,” J. Mod. Opt. 44(3), 519–534 (1997).
[Crossref]

P. Sandoz, “Wavelet transform as a processing tool in white-light interferometry,” Opt. Lett. 22(14), 1065–1067 (1997).
[Crossref] [PubMed]

P. Sandoz, “An algorithm for profilometry by white-light phase-shifting interferometry,” J. Mod. Opt. 43, 1545–1554 (1996).

Schmit, J.

A. Harasaki, J. Schmit, and J. C. Wyant, “Improved vertical-scanning interferometry,” Appl. Opt. 39(13), 2107–2115 (2000).
[Crossref] [PubMed]

Schwider, J.

A. Pf rtner and J. Schwider, “Dispersion error in white-light linnik interferometers and its implications for evaluation procedures,” Appl. Opt. 40(34), 6223–6228 (2001).
[Crossref] [PubMed]

Smith, L. M.

L. M. Smith and C. C. Dobson, “Absolute displacement measurements using modulation of the spectrum of white light in a Michelson interferometer,” Appl. Opt. 28(16), 3339–3342 (1989).
[Crossref] [PubMed]

Turzhitsky, M.

P. de Groot, X. Colonna de Lega, J. Kramer, and M. Turzhitsky, “Determination of fringe order in white-light interference microscopy,” Appl. Opt. 41(22), 4571–4578 (2002).
[Crossref] [PubMed]

Vabre, L.

L. Vabre, A. Dubois, and A. C. Boccara, “Thermal-light full-field optical coherence tomography,” Opt. Lett. 27(7), 530–532 (2002).
[Crossref] [PubMed]

Venzke, H.

T. Dresel, G. Häusler, and H. Venzke, “Three-dimensional sensing of rough surfaces by coherence radar,” Appl. Opt. 31(7), 919–925 (1992).
[Crossref] [PubMed]

Wyant, J. C.

A. Harasaki, J. Schmit, and J. C. Wyant, “Improved vertical-scanning interferometry,” Appl. Opt. 39(13), 2107–2115 (2000).
[Crossref] [PubMed]

Zimmermann, E.

R. Dändliker, E. Zimmermann, and G. Frosio, “Electronically scanned white-light interferometry: a novel noise-resistant signal processing,” Opt. Lett. 17(9), 679–681 (1992).
[Crossref] [PubMed]

Appl. Opt. (11)

T. Dresel, G. Häusler, and H. Venzke, “Three-dimensional sensing of rough surfaces by coherence radar,” Appl. Opt. 31(7), 919–925 (1992).
[Crossref] [PubMed]

A. Hirabayashi, H. Ogawa, and K. Kitagawa, “Fast surface profiler by white-light interferometry by use of a new algorithm based on sampling theory,” Appl. Opt. 41(23), 4876–4883 (2002).
[Crossref] [PubMed]

L. M. Smith and C. C. Dobson, “Absolute displacement measurements using modulation of the spectrum of white light in a Michelson interferometer,” Appl. Opt. 28(16), 3339–3342 (1989).
[Crossref] [PubMed]

S. H. Kim, S. H. Lee, J. I. Lim, and K. H. Kim, “Absolute refractive index measurement method over a broad wavelength region based on white-light interferometry,” Appl. Opt. 49(5), 910–914 (2010).
[Crossref] [PubMed]

G. S. Kino and S. S. C. Chim, “Miraucorrelation microscope,” Appl. Opt. 29(26), 3775–3783 (1990).
[Crossref] [PubMed]

S. S. C. Chim and G. S. Kino, “Three-dimensional image realization in interference microscopy,” Appl. Opt. 31(14), 2550–2553 (1992).
[Crossref] [PubMed]

S. Chen, A. W. Palmer, K. T. V. Grattan, and B. T. Meggitt, “Digital signal-processing techniques for electronically scanned optical-fiber white-light interferometry,” Appl. Opt. 31(28), 6003–6010 (1992).
[Crossref] [PubMed]

A. Pf rtner and J. Schwider, “Dispersion error in white-light linnik interferometers and its implications for evaluation procedures,” Appl. Opt. 40(34), 6223–6228 (2001).
[Crossref] [PubMed]

A. Harasaki, J. Schmit, and J. C. Wyant, “Improved vertical-scanning interferometry,” Appl. Opt. 39(13), 2107–2115 (2000).
[Crossref] [PubMed]

P. de Groot, X. Colonna de Lega, J. Kramer, and M. Turzhitsky, “Determination of fringe order in white-light interference microscopy,” Appl. Opt. 41(22), 4571–4578 (2002).
[Crossref] [PubMed]

S. K. Debnath and M. P. Kothiyal, “Improved optical profiling using the spectral phase in spectrally resolved white-light interferometry,” Appl. Opt. 45(27), 6965–6972 (2006).
[Crossref] [PubMed]

J. Mod. Opt. (3)

P. de Groot and L. Deck, “Surface profiling by analysis of white-light interferograms in the spatial frequency domain,” J. Mod. Opt. 42(2), 389–401 (1995).
[Crossref]

P. Sandoz, “An algorithm for profilometry by white-light phase-shifting interferometry,” J. Mod. Opt. 43, 1545–1554 (1996).

P. Sandoz, R. Devillers, and A. Plata, “Unambiguous profilometry by fringe-order identification in white-light phase-shifting interferometry,” J. Mod. Opt. 44(3), 519–534 (1997).
[Crossref]

J. Opt. Soc. Am. (1)

K. G. Larkin, “Efficient nonlinear algorithm for envelope detection in white-light interferometry,” J. Opt. Soc. Am. 13(4), 832–843 (1996).
[Crossref]

J. Opt. Soc. Am. A (1)

K. Hibino, B. F. Oreb, D. I. Farrant, and K. G. Larkin, “Phase-shifting algorithms for nonlinear and spatially nonuniform phase shifts,” J. Opt. Soc. Am. A 14(4), 918–930 (1997).
[Crossref]

J. Opt. Soc. Kor. (1)

J. G. Kim, “Absolute temperature measurement using white light interferometry,” J. Opt. Soc. Kor. 4(2), 89–93 (2000).
[Crossref]

Opt. Lett. (3)

R. Dändliker, E. Zimmermann, and G. Frosio, “Electronically scanned white-light interferometry: a novel noise-resistant signal processing,” Opt. Lett. 17(9), 679–681 (1992).
[Crossref] [PubMed]

L. Vabre, A. Dubois, and A. C. Boccara, “Thermal-light full-field optical coherence tomography,” Opt. Lett. 27(7), 530–532 (2002).
[Crossref] [PubMed]

P. Sandoz, “Wavelet transform as a processing tool in white-light interferometry,” Opt. Lett. 22(14), 1065–1067 (1997).
[Crossref] [PubMed]

Other (1)

S. Timoshenko and S. Woinowsky-Krieger, Theory of Plates and Shells (McGraw-Hill, 1989).

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Fig. 1 Experimental setup of spatial polarized low-coherence interferometry used to measure air pressure with a Fabry-Pérot sensor.

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Fig. 2 Schematic diagram of the Fabry- Pérot sensor.

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Fig. 3 Spectrum of LED used in experiment and a typical interference signal acquired through a digital acquisition card. (a) LED spectrum. (b) Interference signal.

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Fig. 4 Conceptual illustration of amplitude-frequency and phase-frequency characteristics and the transforming relationship between the relative phase and absolute phase with pressure (xₒ) in theory.

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Fig. 5 Part amplitude-frequency characteristic curve obtained by DFT and phase-contrast curves before and after phase unwrapping. (a) Amplitude-frequency characteristic curve. (b) Wrapped phase-frequency curve. (c) Unwrapped phase-frequency curve.

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Fig. 6 Linearity comparison charts. (a) DFT serial number is 1548. (b) DFT serial number is 1555. (c) DFT serial number is 1558. (d) DFT serial number is 1567.

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Fig. 7 The slope and intercept curves obtained by least square fit of unwrapped-phase-frequency. (a) Characteristic curve between slope and pressure. (b) Characteristic curve between intercept and pressure.

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Fig. 8 Relative phase of the selected frequency Ω₁₅₅₈ obtained by DFT, identified interference-order and the recovered absolute phase using the proposed algorithm. (a) Relative phase. (b) Identified interference order. (c) Recovered absolute phase.

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Fig. 9 Demodulation error curves between the set pressure and demodulated pressure. (a) Phase-slope-based algorithm. (b) The proposed algorithm.

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Tables (1)

Table 1 Quantitative linearity comparison table

View Table

Equations (13)

Equations on this page are rendered with MathJax. Learn more.

Δ d = \frac{3 (1 - υ^{2}) r^{4}}{16 E h^{3}} Δ P

I (x) = γ \exp {{[- α (x - x_{0})]}^{2}} \cos [β (x - x_{0})]

f (x) = γ \exp [- {(α x)}^{2}]

G (Ω) = 1 / 2 F [(Ω + β)] e^{- j Ω x_{0}} + 1 / 2 F ([Ω - β]) e^{- j Ω x_{0}}

M (Ω, x_{0}) = 1 / 2 F [(Ω - β)]

φ (Ω, x_{0}) = - Ω x_{0}

φ (Ω, x_{0}) = Φ (Ω, x_{0}) - 2 m π, Φ (Ω, x_{0}) \in (- π, π), Ω \in (Ω_{s f} - △ Ω, Ω_{s f} + △ Ω)

Φ (Ω, x_{0}) = - x_{0} Ω + 2 m π

Φ' (Ω_{l}, x_{0}) = - x_{0} Ω_{l} + 2 n π, l \in (k - p, k + q)

n = floor(T / 2 π)

φ (Ω_{k}, x_{0}) = Φ (Ω_{k}, x_{0}) - 2 π \times floor (T / 2 π)

{\begin{matrix} Φ' (Ω_{k}) = Φ (Ω_{k}) \\ Φ' (Ω_{k - i - 1}) = Φ (Ω_{k - i - 1}) - 2 π \times floor {[Φ (Ω_{k - i - 1}) - Φ' (Ω_{k - l})] / 2 π} (i = 0, 1, \dots, p - 1) \end{matrix}

{\begin{matrix} Φ' (Ω_{k}) = Φ (Ω_{k}) \\ Φ' (Ω_{k + i + 1}) = Φ (Ω_{k + i + 1}) - 2 π \times [floor {[Φ (Ω_{k + i + 1}) - Φ' (Ω_{k + i})] / 2 π} + 1] (i = 0, 1, \dots, q - 1) \end{matrix}

Frequency	Linearity	Frequency	Linearity	Frequency	Linearity
Ω₁₅₄₇	0.97860	Ω₁₅₅₆	0.99640	Ω₁₅₆₅	0.93082
Ω₁₅₄₈	0.99582	Ω₁₅₅₇	0.99860	Ω₁₅₆₆	0.99883
Ω₁₅₄₉	0.98718	Ω₁₅₅₈	0.99984	Ω₁₅₆₇	0.98470
Ω₁₅₅₀	0.98381	Ω₁₅₅₉	0.99972	Ω₁₅₆₈	0.96867
Ω₁₅₅₁	0.99481	Ω₁₅₆₀	0.99251	Ω₁₅₆₉	0.99907
Ω₁₅₅₂	0.99836	Ω₁₅₆₁	0.99527	Ω₁₅₇₀	0.99920
Ω₁₅₅₃	0.99955	Ω₁₅₆₂	0.98236	Ω₁₅₇₁	0.99881
Ω₁₅₅₄	0.99960	Ω₁₅₆₃	0.99669	Ω₁₅₇₂	0.98655
Ω₁₅₅₅	0.99578	Ω₁₅₆₄	0.98197

Abstract

References

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Boccara, A. C.

Chen, S.

Chim, S. S. C.

Colonna de Lega, X.

Dändliker, R.

de Groot, P.

Debnath, S. K.

Deck, L.

Devillers, R.

Dobson, C. C.

Dresel, T.

Dubois, A.

Farrant, D. I.

Frosio, G.

Grattan, K. T. V.

Harasaki, A.

Häusler, G.

Hibino, K.

Hirabayashi, A.

Kim, J. G.

Kim, K. H.

Kim, S. H.

Kino, G. S.

Kitagawa, K.

Kothiyal, M. P.

Kramer, J.

Larkin, K. G.

Lee, S. H.

Lim, J. I.

Meggitt, B. T.

Ogawa, H.

Oreb, B. F.

Palmer, A. W.

Pf rtner, A.

Plata, A.

Sandoz, P.

Schmit, J.

Schwider, J.

Smith, L. M.

Turzhitsky, M.

Vabre, L.

Venzke, H.

Wyant, J. C.

Zimmermann, E.

Appl. Opt. (11)

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J. Opt. Soc. Am. (1)

J. Opt. Soc. Am. A (1)

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Opt. Lett. (3)

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