Nd:YAG laser with mode locking using a travelling-wave acousto-optic modulator and spherical mirror

A. V. Gribanov, D. V. Yakovin, and M. D. Yakovin

J. Opt. Technol. 87(6), 326-330 (2020)  View: PDF

Generation of high-quality non-diffracting beams using spatial filtering

Ying Zhang, Ke Fan, Jianzhong Lou, and Yan Wei

J. Opt. Technol. 87(6), 331-337 (2020)  View: PDF

Effect of magnetic fields on the dual-frequency active element of a He–Ne laser

V. S. Zorkin, E. G. Chulyaeva, and E. Yu. Gomozkova

J. Opt. Technol. 87(6), 338-341 (2020)  View: PDF

Suppressing the continuous noise of photoreceptor rods under the action of negative feedback formed by a horizontal cell

V. N. Vasil’ev, A. S. Tibilov, and Yu. E. Shelepin

J. Opt. Technol. 87(6), 342-348 (2020)  View: PDF

Characterization of the interaction between ligustroflavone and bovine serum albumin

S. Sun, Z. Yuan, and Y. Q. Lu

J. Opt. Technol. 87(6), 349-354 (2020)  View: PDF

Modified method of orthogonal projection for object recognition in multispectral analysis

A. V. Gerus, O. Yu. Panova, and V. P. Savorskiĭ

J. Opt. Technol. 87(6), 355-360 (2020)  View: PDF

Depth map denoising using a bilateral filter and a progressive CNN

Shuaihao Li, Weiping Zhu, Bin Zhang, Xinfeng Yang, and Min Chen

J. Opt. Technol. 87(6), 361-364 (2020)  View: PDF

Image fusion in a dual-band scanning optoelectronic system for the search and detection of poaching activity

G. N. Markushin, V. V. Korotaev, A. V. Koshelev, I. A. Samokhina, A. S. Vasil’ev, A. V. Vasil’eva, and S. N. Yaryshev

J. Opt. Technol. 87(6), 365-370 (2020)  View: PDF

Optical system of a miniature wide-angle solar sensor

M. P. Kolosov, A. Ya. Gebgart, D. Yu. Lobanov, S. Yu. Zenzinov, and G. L. Tsymbal

J. Opt. Technol. 87(6), 371-375 (2020)  View: PDF

Increasing the accuracy of lidar measurements by using stacked bars in a shock-absorbing system

V. S. Aĭrapetyan, G. A. Kurilenko, and A. A. Rykov

J. Opt. Technol. 87(6), 376-378 (2020)  View: PDF

Using the RGB data of bright-field optical microscopy to efficiently monitor the surface cleanliness of the active elements of semiconductor wafers in the planar production cycle

A. A. Kozyrev, M. V. Goreeva, D. N. Burtsev, and Yu. A. Eliseeva

J. Opt. Technol. 87(6), 379-388 (2020)  View: PDF