Abstract

The method to obtain four speckle patterns with relative phase shift of <TEX>${\pi}/2$</TEX> by passive devices such as two waveplates and a linear polarizer, awl to calculate the phase at each point of the speckle pattern in shearography with a Wollaston prism is presented, and the feasibility of the proposed method is theoretically demonstrated by Jones vector.

© 2004 Optical Society of Korea

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  1. J. A. Leendertz and J. N. Butters, "An image-shearing speckle-pattern interferometer for measuring bending moments," J. Phys. E. vol. 6, pp. 1107-1110, 1973
    [Crossref]
  2. Y. Y. Hung, "Shearography, a new optical method for strain measurement and nondestructive testing," Opt. Eng. vol. 21, no. 3, pp. 391-395, 1982
  3. W. Steinchen, "Quality control of fiber-reinforced composites by means the shearographic and holographic method," Proc. SPIE, vol. 1756, 1992
    [Crossref]
  4. S. L. Toh, F. S. Chau, V. P. W. Shim, C. J. Tay, and H.M. Shang, "Application of shearography in nondestructive testing of composite plates," J. Mater. Process.Technol. vol. 23, pp. 267-275, 1990
    [Crossref]
  5. W. Steinchen, L. X. Yang, M. Schuth, and G. Kupfer, "Application of shearography to quality assurance," J. Mater. Process. Technol. vol. 52, no.1, pp. 141-150, 1992
    [Crossref]
  6. F. S. Chau and T. W. Ng, "A real-time digital shearing speckle interferometer," Measure. Sci. Technol., vol. 3, pp. 381-383, 1992
    [Crossref]
  7. Y. Y. Hung, "A phase shift technique for automation of phase determination in digital shearography," Proc. 1994 SEM spring Conf., Baltimore, MD, 6-7 June 1994, pp. 233-240
  8. W. Steinchen and L. Yang, Digital shearography, SPIE Press, 2003
  9. H. Kim and Y. H. Lee, "Three dimensional relative-distance measurement by use of the phase-shifting digital holography," Hankook Kwanghak Hoeji, vol. 14, no. 2, pp. 200-207, 2003
  10. Y. Y. Hung, "Shearography for non-destructive evaluation of composite structures," Optics and Lasers in Engineering, vol. 24, pp. 161-182, 1996
    [Crossref]
  11. S. Dilhaire, S. Jorez, A. Cornet, L. D. Patino Lopez, W. Claeys, "Measurement of electronic devices by shearography," Microelectronics Reliability, vol. 40, pp. 1509-1514, 2000
    [Crossref]
  12. V. M. Murukeshan, O. L. Seng, and A. Aslundi, "Polarization phase shifting shearography for optical metrological applications," Optics & Laser Technology, vol. 30, pp. 527-531, 1998
    [Crossref]
  13. A. Yariv and P. Yeh, Optical Waves in Crystals (Wiley, New York, 1984), Chap. 5
  14. H. Z. Hu, "Polarization heterodyne interferometry using a simple rotating analyzer. 1: Theory and error analysis," Appl. Opt. vol. 22, no. 13, pp. 2052-2056, 1983
    [Crossref]
  15. M. P. Kothiyal and C. Delisle, "Polarization component phase shifters in phase shifting interferometry: error analysis," Optica Acta, vol. 33, no. 6, pp. 787-793, 1986
    [Crossref]

2003 (2)

W. Steinchen and L. Yang, Digital shearography, SPIE Press, 2003

H. Kim and Y. H. Lee, "Three dimensional relative-distance measurement by use of the phase-shifting digital holography," Hankook Kwanghak Hoeji, vol. 14, no. 2, pp. 200-207, 2003

2000 (1)

S. Dilhaire, S. Jorez, A. Cornet, L. D. Patino Lopez, W. Claeys, "Measurement of electronic devices by shearography," Microelectronics Reliability, vol. 40, pp. 1509-1514, 2000
[Crossref]

1998 (1)

V. M. Murukeshan, O. L. Seng, and A. Aslundi, "Polarization phase shifting shearography for optical metrological applications," Optics & Laser Technology, vol. 30, pp. 527-531, 1998
[Crossref]

1996 (1)

Y. Y. Hung, "Shearography for non-destructive evaluation of composite structures," Optics and Lasers in Engineering, vol. 24, pp. 161-182, 1996
[Crossref]

1994 (1)

Y. Y. Hung, "A phase shift technique for automation of phase determination in digital shearography," Proc. 1994 SEM spring Conf., Baltimore, MD, 6-7 June 1994, pp. 233-240

1992 (3)

W. Steinchen, L. X. Yang, M. Schuth, and G. Kupfer, "Application of shearography to quality assurance," J. Mater. Process. Technol. vol. 52, no.1, pp. 141-150, 1992
[Crossref]

F. S. Chau and T. W. Ng, "A real-time digital shearing speckle interferometer," Measure. Sci. Technol., vol. 3, pp. 381-383, 1992
[Crossref]

W. Steinchen, "Quality control of fiber-reinforced composites by means the shearographic and holographic method," Proc. SPIE, vol. 1756, 1992
[Crossref]

1990 (1)

S. L. Toh, F. S. Chau, V. P. W. Shim, C. J. Tay, and H.M. Shang, "Application of shearography in nondestructive testing of composite plates," J. Mater. Process.Technol. vol. 23, pp. 267-275, 1990
[Crossref]

1986 (1)

M. P. Kothiyal and C. Delisle, "Polarization component phase shifters in phase shifting interferometry: error analysis," Optica Acta, vol. 33, no. 6, pp. 787-793, 1986
[Crossref]

1984 (1)

A. Yariv and P. Yeh, Optical Waves in Crystals (Wiley, New York, 1984), Chap. 5

1983 (1)

H. Z. Hu, "Polarization heterodyne interferometry using a simple rotating analyzer. 1: Theory and error analysis," Appl. Opt. vol. 22, no. 13, pp. 2052-2056, 1983
[Crossref]

1982 (1)

Y. Y. Hung, "Shearography, a new optical method for strain measurement and nondestructive testing," Opt. Eng. vol. 21, no. 3, pp. 391-395, 1982

1973 (1)

J. A. Leendertz and J. N. Butters, "An image-shearing speckle-pattern interferometer for measuring bending moments," J. Phys. E. vol. 6, pp. 1107-1110, 1973
[Crossref]

Applied Optics (1)

H. Z. Hu, "Polarization heterodyne interferometry using a simple rotating analyzer. 1: Theory and error analysis," Appl. Opt. vol. 22, no. 13, pp. 2052-2056, 1983
[Crossref]

Journal of Materials Processing Technology (2)

S. L. Toh, F. S. Chau, V. P. W. Shim, C. J. Tay, and H.M. Shang, "Application of shearography in nondestructive testing of composite plates," J. Mater. Process.Technol. vol. 23, pp. 267-275, 1990
[Crossref]

W. Steinchen, L. X. Yang, M. Schuth, and G. Kupfer, "Application of shearography to quality assurance," J. Mater. Process. Technol. vol. 52, no.1, pp. 141-150, 1992
[Crossref]

Journal of Modern Optics (1)

M. P. Kothiyal and C. Delisle, "Polarization component phase shifters in phase shifting interferometry: error analysis," Optica Acta, vol. 33, no. 6, pp. 787-793, 1986
[Crossref]

Journal of Physics E:Scientific Instruments (1)

J. A. Leendertz and J. N. Butters, "An image-shearing speckle-pattern interferometer for measuring bending moments," J. Phys. E. vol. 6, pp. 1107-1110, 1973
[Crossref]

Korean Journal of Optics and Photonics (1)

H. Kim and Y. H. Lee, "Three dimensional relative-distance measurement by use of the phase-shifting digital holography," Hankook Kwanghak Hoeji, vol. 14, no. 2, pp. 200-207, 2003

Measurement Science Technology (1)

F. S. Chau and T. W. Ng, "A real-time digital shearing speckle interferometer," Measure. Sci. Technol., vol. 3, pp. 381-383, 1992
[Crossref]

Microelectronics Reliability (1)

S. Dilhaire, S. Jorez, A. Cornet, L. D. Patino Lopez, W. Claeys, "Measurement of electronic devices by shearography," Microelectronics Reliability, vol. 40, pp. 1509-1514, 2000
[Crossref]

Optical Engineering (1)

Y. Y. Hung, "Shearography, a new optical method for strain measurement and nondestructive testing," Opt. Eng. vol. 21, no. 3, pp. 391-395, 1982

Optics & Laser Technology (1)

V. M. Murukeshan, O. L. Seng, and A. Aslundi, "Polarization phase shifting shearography for optical metrological applications," Optics & Laser Technology, vol. 30, pp. 527-531, 1998
[Crossref]

Optics and Lasers in Engineering (1)

Y. Y. Hung, "Shearography for non-destructive evaluation of composite structures," Optics and Lasers in Engineering, vol. 24, pp. 161-182, 1996
[Crossref]

Proc. 1994 SEM spring Conf. (1)

Y. Y. Hung, "A phase shift technique for automation of phase determination in digital shearography," Proc. 1994 SEM spring Conf., Baltimore, MD, 6-7 June 1994, pp. 233-240

Proc. SPIE (1)

W. Steinchen, "Quality control of fiber-reinforced composites by means the shearographic and holographic method," Proc. SPIE, vol. 1756, 1992
[Crossref]

Other (2)

W. Steinchen and L. Yang, Digital shearography, SPIE Press, 2003

A. Yariv and P. Yeh, Optical Waves in Crystals (Wiley, New York, 1984), Chap. 5

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