Abstract

First-order diffraction from thin crystals of photorefractive Bi₁₂SiO₂₀ and Bi₁₂TiO₂₀ is investigated for application to real-time holographic interferometry. Enhancement of the first-order diffracted beam is achieved through the application of a square-wave alternating electric field to the crystals. Results of the dependence of first-order diffraction on experimental parameters are presented and are discussed in relation to the limits that they impose on the design of a real-time holographic interferometer. The resultant interferometer is applied to produce double-exposure interferograms of a simple object.

© 1992 Optical Society of America

Efficiency and polarization characteristics of photorefractive diffraction in a Bi₁₂SiO₂₀ crystal

S. Mallick, D. Rouède, and A. G. Apostolidis
J. Opt. Soc. Am. B 4(8) 1247-1259 (1987)

Electrophotochromic gratings in photorefractive Bi₁₂TiO₂₀ crystals

A. A. Kamshilin, J. Frejlich, and P. M. Garcia
Appl. Opt. 31(11) 1787-1793 (1992)

Noise and sensitivity characteristics of Bi₁₂SiO₂₀ crystals for optimization of a real-time self-diffraction holographic interferometer

R. C. Troth, S. L. Sochava, and S. I. Stepanov
Appl. Opt. 30(26) 3756-3761 (1991)

Holographic interferometry using anisotropic self-diffraction in Bi₁₂SiO₂₀

R. C. Troth and J. C. Dainty
Opt. Lett. 16(1) 53-55 (1991)

Experimental comparison of the ac field and the moving-grating holographic-recording techniques for Bi₁₂SiO₂₀ and Bi₁₂TiO₂₀ photorefractive crystals

S. L. Sochava, E. V. Mokrushina, V. V. Prokof’ev, and S. I. Stepanov
J. Opt. Soc. Am. B 10(9) 1600-1604 (1993)