Abstract

Gold nanoparticles (GNPs) are very often used as handles for nanotechnological micromanipulation. In this regard, optical trapping of GNPs is of great importance, in which locating the trapped GNP within the focal spot with nanometer precision is crucial. Very recently, we have introduced a new position detection system for optical tweezers based on moiré deflectometry (MD). Here we show, both theoretically and experimentally, that an MD detection system could provide significantly larger detection sensitivity for a trapped GNP compared to that provided by conventional back focal plane (BFP) detection systems. For instance, for a trapped 200 nm GNP, the detection sensitivity provided by the MD detection method is 280% better than that provided by the BFP detection method.

© 2021 Optical Society of America

Backscattering-based detection scheme for dark-field optical tweezers

Akbar Samadi, S. Masoumeh Mousavi, Faegheh Hajizadeh, and S. Nader S. Reihani
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Moiré deflectometry-based position detection for optical tweezers

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J. Opt. Soc. Am. B 39(12) 3209-3215 (2022)

3D calibration of microsphere position in optical tweezers using the back-focal-plane interferometry method

Wenqiang Li, Hanlin Zhang, Mengzhu Hu, Qi Zhu, Heming Su, Nan Li, and Huizhu Hu
Opt. Express 29(20) 32271-32284 (2021)