Characterization of thin-film optical properties by THz near-field imaging method

F. Amirkhan; R. Sakata; K. Takiguchi; T. Arikawa; T. Ozaki; K. Tanaka; F. Blanchard

doi:10.1364/JOSAB.36.002593

Journal of the Optical Society of America B
Vol. 36,
Issue 9,
pp. 2593-2601
(2019)
•https://doi.org/10.1364/JOSAB.36.002593

Characterization of thin-film optical properties by THz near-field imaging method

F. Amirkhan, R. Sakata, K. Takiguchi, T. Arikawa, T. Ozaki, K. Tanaka, and F. Blanchard

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F. Amirkhan, R. Sakata, K. Takiguchi, T. Arikawa, T. Ozaki, K. Tanaka, and F. Blanchard, "Characterization of thin-film optical properties by THz near-field imaging method," J. Opt. Soc. Am. B 36, 2593-2601 (2019)

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Abstract

We present a new method to characterize thin-film electro-optic materials. The method is based on resolving the electric and/or magnetic field distributions in the near-field region of a split-ring resonator (SRR) designed for the terahertz (THz) frequency range. We experimentally validate our simulations by THz near-field imaging of SRRs directly patterned in contact with a thin-film lithium niobate crystal as a sensor. Furthermore, we analytically study the effect of the different applied electric field polarizations and calculate the sensitivity of the sensor via various polarizations of probe beams.

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Supplementary Material (1)

Name	Description
Visualization 1	Experimental near-field measurement.

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SRR Angle $θ$	Response in $E_{y}$ Direction $\sim E_{y} (\cos (θ))^{2}$	Simulation Measurements $E_{y}$ (0.46 THz)	EO Coefficient $Γ$ (pm/V)	Expected Weighted Response	Experiment Results $E_{y}$ (0.44 THz)	Experiment Results $E_{y}$ (0.49 THz)
0	1	1	163	1	$1 \pm 3.7 %$	$1 \pm 3.6 %$
30	0.75	0.78	142	0.75	$0.72 \pm 3.8 %$	$0.77 \pm 3.0 %$
45	0.50	0.49	116	0.50	$0.41 \pm 7.2 %$	$0.64 \pm 3.2 %$
60	0.25	0.25	82	0.25	$0.16 \pm 7.5 %$	$0.18 \pm 4.0 %$
90	0	None	None	None	None	None

SRR Angle $θ$	Response in $E_{y}$ Direction $\sim E_{y} (\cos (θ))^{2}$	Simulation Measurements $E_{y}$ (0.46 THz)	EO Coefficient $Γ$ (pm/V)	Expected Weighted Response	Experiment Results $E_{y}$ (0.44 THz)	Experiment Results $E_{y}$ (0.49 THz)
0	1	1	163	1	$1 \pm 3.7 %$	$1 \pm 3.6 %$
30	0.75	0.78	142	0.75	$0.72 \pm 3.8 %$	$0.77 \pm 3.0 %$
45	0.50	0.49	116	0.50	$0.41 \pm 7.2 %$	$0.64 \pm 3.2 %$
60	0.25	0.25	82	0.25	$0.16 \pm 7.5 %$	$0.18 \pm 4.0 %$
90	0	None	None	None	None	None

Abstract

Supplementary Material (1)

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Tables (3)

Equations (7)

Journal of the Optical Society of America B