Abstract

In present work, we use an electromagnetic surface mode excited at the interface of a finite one-dimensional photonic crystal utilizing a modified attenuated total reflection setup by capturing the images formed by the scattered surface waves under transmission to determine the thickness distribution of a non-uniform thin film ($<100\mathrm{nm}$) over an extended millimeter-sized area. The sensitivity of the proposed technique is analyzed by considering a step coating that presents two different regions of different thickness, which shifts the resonant conditions of the surface mode.

© 2019 Optical Society of America

Experimental determination of a surface wave at the one-dimensional photonic crystal-metal interface

Aldo S. Ramírez-Duverger, Jorge Gaspar-Armenta, and Raúl García-Llamas
J. Opt. Soc. Am. B 25(6) 1016-1024 (2008)

Photonic crystal sensor based on surface waves for thin-film characterization

F. Villa, L. E. Regalado, F. Ramos-Mendieta, J. Gaspar-Armenta, and T. Lopez-Ríos
Opt. Lett. 27(8) 646-648 (2002)

Band-structure properties of one-dimensional photonic crystals under the formalism of equivalent systems

Jorge A. Gaspar-Armenta and Francisco Villa
J. Opt. Soc. Am. B 21(2) 405-412 (2004)

Electromagnetic surface waves at a metal 2D photonic crystal interface

J. A. Gaspar-Armenta and F. Villa-Villa
J. Opt. Soc. Am. B 30(8) 2271-2276 (2013)

Photonic surface-wave excitation: photonic crystal–metal interface

Jorge A. Gaspar-Armenta and Francisco Villa
J. Opt. Soc. Am. B 20(11) 2349-2354 (2003)