Abstract

Transition rates for 321 lines between 345 and 1080 nm from 73 levels of Ho i are presented. They have been measured by combining branching fractions obtained by Fourier transform spectrometry with lifetimes of Den Hartog, et al. [J. Opt. Soc. Am. B 6, 2278 (1999)]. The uncertainty of the transition rates is 5%–10%.

© 2003 Optical Society of America

Radiative lifetimes of Ho i and Ho ii

E. A. Den Hartog, L. M. Wiese, and J. E. Lawler
J. Opt. Soc. Am. B 16(12) 2278-2284 (1999)

Atomic transition probabilities for Tm i and Tm ii

M. E. Wickliffe and J. E. Lawler
J. Opt. Soc. Am. B 14(4) 737-753 (1997)

Laser optogalvanic spectroscopy of holmium

M. N. Reddy, S. A. Ahmad, and G. N. Rao
J. Opt. Soc. Am. B 9(1) 22-26 (1992)

Experimental branching fractions, transition probabilities, and oscillator strengths in Sn I

Liyun Jiang, Qian Wang, Songhao Pei, Yanyan Feng, Jirong Zhang, Xiance Yu, and Zhenwen Dai
J. Opt. Soc. Am. B 29(6) 1486-1489 (2012)

Branching fractions and transition probabilities for transitions from 2p⁴ 3p, 2p⁴ 3d, and 2p⁴ 4s levels of Ne ii

Ulf Griesmann, Józef Musielok, and Wolfgang L. Wiese
J. Opt. Soc. Am. B 14(9) 2204-2211 (1997)