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Hyperfine structure measurements of the line 613.4 nm in bismuth using a Fourier-transform spectrometer

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Abstract

The structure of the line λ=613.4nm(6p32P3/2°7s2P3/2) in Bi i has been completely analyzed by means of a Fourier-transform spectrometer. From the intensity calculations it is seen that only 9 components of the possible 10 can be observed. The A and B constants are also calculated and compared with earlier results. The values of the levels 7s 2P3/2 and 6p32P3/2° have been recalculated to be 49 460.91 ±0.01 and 33 164.82 ±0.01 cm−1, respectively.

© 1985 Optical Society of America

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