Abstract
Ge- and Ti-doped silica thin films were prepared upon various substrates by solgel processing and rf sputtering. Large second-harmonic generation was measured from thermally poled thin-film samples. The origin of nonlinearity and its distribution from thermally poled silicate thin films were investigated. Moreover, we measured the stability of the nonlinearity of a rf-sputtered germanosilicate thin film upon a silica glass substrate against heat and intense laser light sufficient for the fabrication of waveguide-type nonlinear optical devices.
© 1998 Optical Society of America
Full Article | PDF ArticleMore Like This
Mingxin Qiu, F. Pi, G. Orriols, and M. Bibiche
J. Opt. Soc. Am. B 15(4) 1362-1365 (1998)
A. Ozcan, M. J. F. Digonnet, G. S. Kino, F. Ay, and A. Aydinli
Opt. Express 12(20) 4698-4708 (2004)
Hiroyuki Nasu, Hideki Okamoto, Kiyoshi Kurachi, Jun Matsuoka, Kanichi Kamiya, Akihiro Mito, and Hideo Hosono
J. Opt. Soc. Am. B 12(4) 644-649 (1995)