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Precise second-harmonic generation Maker fringe measurements in single crystals of the diacetylene NP/4-MPU and evaluation by a second-harmonic generation theory in 4 × 4 matrix formulation and ray tracing

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Abstract

Accurate second-harmonic generation (SHG) measurements in birefringent single crystals of the asymmetrically substituted diacetylene NP/4-MPU were performed with a 10-ns pulsed laser system with small bandwidth. The measurements show typical oscillations, which overlie the well-known Maker fringe pattern. These oscillations can be explained by interference between the incident fundamental wave and its reflections at the front and back sides of the crystal. The interference is described by a ray-tracer algorithm, which takes into account the beam profile. Furthermore, because the investigated material is biaxially birefringent at its principal axes, the theory for SHG proposed by Okamoto, et al. [J. Opt. Soc. Am. B 9, 2083 (1992)] was extended for this case and is written in a compact 4×4 matrix formulation. By using the additional information of the interference of the fundamental wave, we evaluated and fitted the measurements with greater accuracy.

© 1997 Optical Society of America

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