Abstract

An analytical model is developed to describe transient grating formation in surface-charge-dominated Pockels readout optical modulator devices for long exposures. It is shown that, under a short-transport-length approximation, solutions to the one-dimensional transport equations reveal the existence of thin carrier accumulation and depletion regions in the inner photoconductive layer near the dielectric–photoconductive interfaces. Rate equations for the accumulation of the net surface charge at these interfaces are derived and are solved self-consistently in a small-modulation approximation. The temporal behavior of the internal field and the grating-spacing dependence of the time response and of the grating amplitude are examined. It is shown that field fringing significantly affects the time response and the device resolution at small grating spacings. The general dependence of device performance on geometry is also discussed.

© 1994 Optical Society of America

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