Abstract

Time-resolved temperature-dependent beam-deflection spectroscopy has been used to investigate Ti:sapphire. Signals produced by thermal and nonthermal changes in the index of refraction were observed. The temperature behavior of the thermal part of the signal is in agreement with a theoretical model that includes the temperature dependence of the thermal diffusivity D. To our knowledge this is the first time that temperature-dependent beam-deflection spectroscopy has been carried out down to 20 K.

© 1993 Optical Society of America

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