Abstract

Relatively simple mathematical models are developed to determine the optical density as a function of the x-ray intensity, its angle of incidence, and its photon energy in the 100–10,000-eV region for monolayer and emulsion types of photographic films. Semiempirical relations are applied to characterize a monolayer film (Kodak 101-07) and an emulsion-type film (Kodak RAR 2497); these relations fit calibration data at nine photon energies well within typical experimental error.

© 1984 Optical Society of America

Low-energy x-ray response of photographic films. II. Experimental characterization

B. L. Henke, F. G. Fujiwara, M. A. Tester, C. H. Dittmore, and M. A. Palmer
J. Opt. Soc. Am. B 1(6) 828-849 (1984)

High-energy x-ray response of photographic films: models and measurement

B. L. Henke, J. Y. Uejio, G. F. Stone, C. H. Dittmore, and F. G. Fujiwara
J. Opt. Soc. Am. B 3(11) 1540-1550 (1986)

Photographic response to x-ray irradiation. I: Estimation of the photographic error statistic and development of analytic density-intensity equations

C. T. Chantler
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Photographic response to x-ray irradiation. II: Correlated models

C. T. Chantler
Appl. Opt. 32(13) 2398-2410 (1993)

X-ray calibration of RAR 2490 film for application to laser plasma experiments

Robert F. Benjamin, Peter B. Lyons, and Robert H. Day
Appl. Opt. 16(2) 393-397 (1977)