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Recording ultrafine interference patterns of evanescent waves at a silver–photoresist interface

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Abstract

We investigated the ultrafine fringe patterns that result from the interference of counterpropagating, evanescent surface waves that are supported in a layered silver–photoresist geometry. The surface waves that we considered were single-interface surface plasmons, long-range coupled surface plasmons, and short-range coupled surface plasmons. Calculations predicted sinusoidal intensity fringes with periodicities ranging from 100 to 140 nm when the surface waves were generated by light of 488-nm wavelength. The variance of the fringe periodicity and other fringe properties as a function of changing silver film thickness was also investigated.

© 1992 Optical Society of America

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