Abstract

A mathematical description of the reflection spectrum R(λ) of a thin dielectric layer on a transmitting substrate is represented at inclined incidence of nonpolarized or s- or p-polarized light. The finite dimensions of the substrate and its absorption are taken into account in the calculations. An approximation of the envelopes along the maxima and the minima of the spectrum, R_M(λ) and R_m(λ), respectively, is performed. A way of computing the optical constants n(λ) and k(λ) and the thickness d of the layer of the envelopes R_M(λ) and R_m(λ) is proposed. The computation of the optical constants of the layer for a model of an optical system shows that, for angles of incidence Φ smaller than the Brewster angle Φ_b, a high accuracy of the computed results is achieved.

© 1991 Optical Society of America

Reflection and transmission of a Hermite–Gaussian beam incident upon a curved dielectric layer

Takato Kudou, Mitsuhiro Yokota, and Otozo Fukumitsu
J. Opt. Soc. Am. A 8(5) 718-723 (1991)

Determination of optical constants of absorbing crystalline thin films from reflectance and transmittance measurements with oblique incidence

Haiming Wang
J. Opt. Soc. Am. A 11(8) 2331-2337 (1994)

Reflection of light in a long-wavelength approximation from an N-layer system of inhomogeneous dielectric films and optical diagnostics of ultrathin layers. II. Transparent substrate

Peep Adamson
J. Opt. Soc. Am. B 21(3) 645-654 (2004)

Light scattering from random rough dielectric surfaces

J. A. Sánchez-Gil and M. Nieto-Vesperinas
J. Opt. Soc. Am. A 8(8) 1270-1286 (1991)

Angular range for reflection of p-polarized light at the surface of an absorbing medium with reflectance below that at normal incidence

R. M. A. Azzam and Ericson E. Ugbo
J. Opt. Soc. Am. A 19(1) 112-115 (2002)