Abstract
Independent measurements of the rms roughness and the reflectance have been made
on silver films deposited on CaF2, LiF, and MgF2 thin
films of various degrees of roughness. These measurements show a linear
relationship between the dip in the magnitude of the near-normal reflectance
minimum at the plasma energy and the rms roughness δ of the
various samples. The autocovariance length of the rough surface turns out to
have little influence on the relationship between the magnitude of the
reflectance and δ. The relationships between the optical
constants of silver films and δ are also investigated.
© 1990 Optical Society of America
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