Abstract

A mathematical procedure for obtaining theoretically an expression for the fields of a beam reflected by a planar interface separating two lossless, linear, isotropic, homogeneous media is presented. Comparison of this expression with that obtained when the beam undergoes reflection from a perfect conductor leads to the expression for the angular shift of the beam reflected by a planar dielectric interface. The cases of normal and parallel polarization of a microwave beam are considered. In the last case, a complete study for angles of incidence far and near the Brewster angle is made.

© 1989 Optical Society of America

Modified reflectance and geometrical deformations of Gaussian beams reflected at a dielectric interface

W. Nasalski
J. Opt. Soc. Am. A 6(9) 1447-1454 (1989)

Displacement of the intensity peak in narrow beams reflected at a dielectric interface

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Nonspecular transverse effects of polarized and unpolarized symmetric beams in isotropic–uniaxial interfaces

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Nonspecular phenomena on Gaussian beam reflection at dielectric interfaces

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