Extreme attenuation of total internal reflection used for determination of optical properties of metals

Abstract

It is shown that attenuation of total internal reflection, when measured under conditions in which the reflectivity is minimized with respect to the thickness of the intermediate layer for a three-layer structure, might be well suited for determining the dielectric function of metals. Experimental results for several metals in the optical range of the spectrum are presented.

© 1987 Optical Society of America

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