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Beam phenomena at and near critical incidence upon a dielectric interface

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Abstract

Nonspecular phenomena involving Gaussian beams reflected at a dielectric interface include the well-known lateral displacement, the more recently investigated focal and angular shifts, and a fourth newly recognized effect termed beam-waist modification. In the past, expressions for the magnitudes of these effects have been obtained for incidence angles θi that are not too close to the critical angle of total reflection θc, but results for θi near θc have been reported only for lateral displacement. We have therefore examined all the four effects and derived explicit expressions that hold for arbitrary values of θi in the vicinity of θc. These expressions are consistent with the results obtained by others for θiθc as well as with those for the lateral displacement around θi= θc. We find that the nonspecular effects are finite at θc, and we include a set of universal curves to clarify the behavior and interrelations of these phenomena.

© 1987 Optical Society of America

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