Abstract

A simple technique for final correction of aberrated diffraction patterns calculated by using the fast-Fourier-transform–quasi-fast-Hankel-transform (FFT–QFHT) algorithm is proposed. In order to compensate for the influence of the artificial obscuration in the sampling grid (which is unavoidable when Siegman’s QFHT algorithm is used), the proper field contribution associated with a defocused perfect system is finally added to the diffraction pattern just computed. Such a global correction technique utilizes simple analytic approximations to corresponding diffraction integrals and permits the number of samples in the exit pupil to be reduced significantly. On the basis of first numerical experiments it appears that a factor-of-4 improvement in both running time and occupied memory is achieved.

© 1987 Optical Society of America

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