Reflection formulae for ray tracing in uniaxial anisotropic media using Huygens’s principle

Abstract

Ray tracing in uniaxial anisotropic materials is important because they are widely used for instrumentation, liquid-crystal displays, laser cavities, and quantum experiments. There are previous works regarding ray tracing refraction and reflection formulae using the common electromagnetic theory approach, but only the refraction formulae have been deduced using Huygens’s principle. In this paper we obtain the reflection expressions using this unconventional approach with a specific coordinate system in which both refraction and reflection formulae are simplified as well as their deduction. We compute some numerical examples to compare them with the common expressions obtained using electromagnetic theory.

© 2016 Optical Society of America

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