Abstract

Formulas for modeling ellipsometric measurements of bianisotropic crystals assume perfectly coherent plane wave illumination. As such, the finite coherence of typical spectroscopic ellipsometers renders such formulas invalid for crystals thicker than a few micrometers. Reflection measurements of thick crystalline slabs show depolarization. Researchers have proposed strategies for the full accounting for multiply reflected incoherent waves in anisotropic, arbitrarily oriented crystals [Appl. Opt. 41, 2521 (2002). [CrossRef]  ], but to the best of our knowledge these methods have not been tested by explicit measurements. It is shown that by a summation of multiply reflected incoherent waves, transmission and reflection measurements of thick quartz slabs can be interpreted in terms of the constitutive material parameters.

© 2015 Optical Society of America

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