Abstract

Fourier analysis is commonly utilized as a design tool for either (two-dimensional) optics or (one-dimensional) electronic systems. This paper presents a two-dimension to one-dimension transformation that allows the unified linear system analysis of both the optics and the electronics of an electro-optic system. The transformation, related to the projection-slice theorem, permits the definition of three variants of the matched filter. These filters optimize all electronic and optic components of a scanning electro-optic system that is sensing a source superimposed upon a structured background with a |f|⁻ⁿ power spectral density, where f is the vector representation of the background spatial frequency and n is typically 2.

© 1986 Optical Society of America

Programmable modified systolic array for fast one- and two-dimensional convolutions

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