Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Improved Ronchi test with extended source

Not Accessible

Your library or personal account may give you access

Abstract

A modified Ronchi test with an extended source is presented. By the use of a matched pair of source grating and Ronchi grating, a pure shearogram between two shifted wave fronts is obtained, and the extra interference with other disturbing grating orders is largely suppressed by the use of a specific grating layout.

© 1999 Optical Society of America

Full Article  |  PDF Article
More Like This
Fringe contrast interpretation for an extended source Ronchi test

Krzysztof Patorski and Alejandro Cornejo-Rodriguez
Appl. Opt. 25(16) 2790-2795 (1986)

Single sideband Ronchi test

J. Schwider
Appl. Opt. 20(15) 2635-2642 (1981)

Phase measuring Ronchi test

Katsuyuki Omura and Toyohiko Yatagai
Appl. Opt. 27(3) 523-528 (1988)

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Figures (7)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Equations (71)

You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.