Abstract

Thresholds of 1-deg, 200-msec, 641-nm foveal test flashes rise after an exchange of Π₅-equated 536- and 626-nm fields, taking about 30 sec to recover. Silent substitution (no rise of threshold after the exchange) occurs, however, if these fields are alternated during adaptation. Thresholds for a 1-deg, 20-msec test rise similarly after an exchange but recover in only 0.5 sec and are not influenced by alternation of the 536- and 626-nm fields. These results can be accounted for if the 641-nm tests are detected not through pathways controlled by long-wavelength cones alone but through nonopponent (20-msec) and opponent (200-msec) pathways whose sensitivities may be reduced by transient inputs from other cones.

© 1982 Optical Society of America

Pi-4: adaptation of more than one class of cone

Claude Sigel and Lisa Brousseau
J. Opt. Soc. Am. 72(2) 237-246 (1982)

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Robert M. Herrick
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Increment Thresholds for Two Nonidentical Flashes*

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Foveal increment thresholds for multiple flashes*

Robert M. Herrick
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Negative Flashes, Positive Flashes, and Flicker Examined by Increment Threshold Technique*

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J. Opt. Soc. Am. 55(5) 560-566 (1965)