Abstract

A combination of analytical synthesis methods and automatic numerical design is currently used for the synthesis of optical thin-film systems. The validity of this combination strongly depends not only on the optimization technique chosen but also on the construction of the merit function used in the automatic design. The present paper introduces a statistical testing method by which global extrema of a merit function can be found with a certain probability. Some examples of the construction of the merit function based on analytical synthesis are given.

© 1982 Optical Society of America

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