Abstract

A technique is presented for computing the spatial variation of dielectric permittivity in waveguides, directly from the distribution with mode number of the mode indices. The method applies to two-dimensional as well as to three-dimensional axially symmetric media in which the permittivity varies only in a direction transverse to the axis of guidance. It provides a means for inverting the well-known WKB formula for mode guidance, and by design contains only the limitations that are inherent in the WKB asymptotic method.

© 1975 Optical Society of America

Index-profile determination of heterostructure GaAs planar waveguides from mode-angle measurements at 10.6 μm wavelength

W. W. Rigrod, J. H. McFee, M. A. Pollack, and R. A. Logan
J. Opt. Soc. Am. 65(1) 46-55 (1975)

Transmission and reflection of a gaussian beam at normal incidence on a dielectric slab

T. Ooya, M. Tateiba, and O. Fukumitsu
J. Opt. Soc. Am. 65(5) 537-541 (1975)

Light scattering from optical fibers with arbitrary refractive-index distributions

D. Marcuse and H. M. Presby
J. Opt. Soc. Am. 65(4) 367-375 (1975)

Calculation of arbitrary-order diffraction efficiencies of thick gratings with arbitrary grating shape*

S. F. Su and T. K. Gaylord
J. Opt. Soc. Am. 65(1) 59-64 (1975)

Thermal self-focusing of TEM₀₁ laser beams and ring-shape self-focusing of two specific mixtures of modes*

M. S. Sodha and V. P. Nayyar
J. Opt. Soc. Am. 65(9) 1027-1030 (1975)