Abstract

A general formula for the expected value of the error in the measured optical transfer function due to noise has been derived from a matrix expression of the digital Fourier-transform process and introducing an error matrix. A new method of OTF measurement, using a multiple slit, is proposed and compared with the conventional single-slit and knife-edge scanning methods. The relation between the expected value of the error in the optical transfer function and that in the modulation transfer function is studied theoretically. Experiments have been carried out to verify the results of the analysis.

© 1975 Optical Society of America

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