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Refractive Index and Birefringence of 2H Silicon Carbide

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Abstract

The refractive indices of 2H SiC were measured over the wavelength range 435.8–650.9 nm by the method of minimum deviation. A curve fit of the experimental data to the Cauchy dispersion equation yielded, for the ordinary index, no = 2.5513+2.585×1042+8.928×1084 and, for the extraordinary index, ne = 2.6161 +2.823×1042+11.490×1084 when λ is expressed in nm. The estimated error (standard deviation) in these values is ±0.0006 for no and ±0.0009 for ne. The birefringence calculated from these expressions is about 20% less than previously published values.

© 1972 Optical Society of America

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