Abstract

A procedure is described for simultaneously fitting reflectance data obtained for various photon energies and angles of incidence using a simple physical model for ∊(ω), the complex frequency-dependent dielectric constant. The mutual consistency of the model and of the experimental data is tested, within the accuracy of each measurement. As an example of the technique, reflectance data in the vacuum ultraviolet obtained by Toots, Fowler, and Marton for Be, Ge, Sb, and Bi have been satisfactorily fitted. The model parameters have been used to derive the optical constants n and k (in satisfactory agreement with conventional determinations) and can be readily related to other relevant experimental results or theoretical calculations of ∊(ω) if these are available.

© 1970 Optical Society of America

Analysis of Optical- and Inelastic-Electron-Scattering Data. II. Application to Al*†

C. J. Powell
J. Opt. Soc. Am. 60(1) 78-93 (1970)

Analysis of Optical- and Inelastic-Electron-Scattering Data. Parametric Calculations*†

C. J. Powell
J. Opt. Soc. Am. 59(6) 738-743 (1969)

Optical Properties of Antimony and Bismuth in the Far Ultraviolet

J. Toots and L. Marton
J. Opt. Soc. Am. 59(10) 1305-1308 (1969)

Optical Constants of Germanium in the Region of the M_4,5 Edge*

B. Feuerbacher, M. Skibowski, R. P. Godwin, and T. Sasaki
J. Opt. Soc. Am. 58(11) 1434-1440 (1968)

Optical Properties of Molybdenum and Ruthenium*

Kenneth A. Kress and Gerald J. Lapeyre
J. Opt. Soc. Am. 60(12) 1681-1684 (1970)