Abstract

The reflectance of millimeter waves has been studied for a planar arrangement of a semiconductor panel, an air space, and a metal reflector. For a given wavelength, by adjusting mechanical dimensions and material properties, we observed complete absorption. In these types of systems, changes of conductivity of the semiconductor panel resulted in variations of reflectance. New devices using this physical effect are suggested, such as a device for amplitude modulation of millimeter and submillimeter waves, a simplified interferometer, and an arrangement for conversion of millimeter- and submillimeter-wave images into visual displays.

© 1967 Optical Society of America

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Figures (12)

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