Abstract

The Duc de Chaulnes’ image-displacement method is refined to account for errors associated with thin slices of crystals and found to give results accurate to ±0.006 in the 2.4-refractive index range. Some of the inherent errors of the method are accounted for exactly, while others are treated statistically. The method has distinct advantages in measuring n at selected sites in solids and in determining indices at ranges above those of useful immersion media. The ordinary-ray index in BaTiO₃ was measured on two crystals at room temperature, and the average index determined was 2.369±0.31% (the crystal thicknesses were 0.0126 and 0.0209 cm).

© 1964 Optical Society of America

Further refinements of the Duc de Chaulnes method to determine the principal refractive indices of small doubly refracting crystals

L. V. Deshpande, M. B. Joshi, and R. B. Mishra
J. Opt. Soc. Am. 70(9) 1160-1163 (1980)

Moiré Patterns: Their Application to Refractive Index and Refractive Index Gradient Measurements

Yasunori Nishijima and Gerald Oster
J. Opt. Soc. Am. 54(1) 1-5 (1964)

Due de Chaulnes’ Method for Refractive-Index Determination

Arthur Miller
J. Opt. Soc. Am. 58(3) 428-428 (1968)

Determination of the Refractive Index of Thin Dielectric Films*

Michael Hacskaylo
J. Opt. Soc. Am. 54(2) 198-203 (1964)

Optical Constants of Metals in the Extreme Ultraviolet. I. A Modified Critical-Angle Technique for Measuring the Index of Refraction of Metals in the Extreme Ultraviolet*

W. R. Hunter
J. Opt. Soc. Am. 54(1) 15-19 (1964)