Abstract

The principles of the immersion spectrophotometry of interference films are discussed. A practical application is presented for determining directly the refractive indices of thin films in situ on solid substrates. With this method the spectrophotometric peak heights are measured with the specimen immersed in various fluids. The plot of peak height vs index of refraction of the immersion medium is a smooth line going through zero at the refractive index of the interference layer. The mathematical basis of the method is developed and data for fluoride films on uranium dioxide and for anodic oxide films on uranium metal are presented.

© 1963 Optical Society of America

Optical Properties of Anodic-Oxide Interference Films on Uranium Immersed in Refractive Media*

W. P. Ellis and E. D. Megarity
J. Opt. Soc. Am. 54(2) 225-228 (1964)

Immersion Spectrophotometry of Vapor-Deposited Films: I. Comparison with Angular Reflectance Measurements, and II. Aging Effects*

A. D. Mulford, L. D. Allen, and W. P. Ellis
J. Opt. Soc. Am. 57(6) 763-769 (1967)

Some Observations on the Use of Elliptically Polarized Light to Study Metal Surfaces*

Frederick P. Mertens, Paul Theroux, and Robert C. Plumb
J. Opt. Soc. Am. 53(7) 788-796 (1963)

Criterion of Surface Roughness Applied to Reflection by Fluoride Interference Films on Uranium Dioxide. Refractive Index of Uranium Dioxide*

Walton P. Ellis
J. Opt. Soc. Am. 54(2) 265_1-266 (1964)

On the Vacuum-Ultraviolet Reflectance of Evaporated Aluminum before and during Oxidation*

R. P. Madden, L. R. Canfield, and G. Hass
J. Opt. Soc. Am. 53(5) 620-625 (1963)