Abstract

The validity of the stepped interference reflector method (described in Part I of this paper) is tested over the range of refractive indices 1.25 to 2.0, and film thickness 10 A to 250 A. It is shown by comparison of results with those obtained by independent means (Abelès) that the method works well in the above thickness range, and for indices between 1.4 and 1.7, but needs additional testing outside these limits. The apparatus and procedures are described and the results of measurements of three different types of films, (transferred, evaporated, and adsorbed) involving 9 different substances are reported. The procedures are simple, and measurements and calculations of index and thickness of an unknown film may be completed in 1 hr.

© 1956 Optical Society of America

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Corrections

Peter H. Berning, "Errata: Note concerning multiple reflections within absorbing thin films," J. Opt. Soc. Am. 47, 767_1-767 (1957)
http://proxy.osapublishing.org/josa/abstract.cfm?uri=josa-47-8-767_1

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