Abstract

The validity of the stepped interference reflector method (described in Part I of this paper) is tested over the range of refractive indices 1.25 to 2.0, and film thickness 10 A to 250 A. It is shown by comparison of results with those obtained by independent means (Abelès) that the method works well in the above thickness range, and for indices between 1.4 and 1.7, but needs additional testing outside these limits. The apparatus and procedures are described and the results of measurements of three different types of films, (transferred, evaporated, and adsorbed) involving 9 different substances are reported. The procedures are simple, and measurements and calculations of index and thickness of an unknown film may be completed in 1 hr.

© 1956 Optical Society of America

Stepped Interference Reflector for Determining the Optical Constants of Nonabsorbing Unimolecular Films. I. Theory

Richard D. Mattuck
J. Opt. Soc. Am. 46(8) 621-628 (1956)

Recent Attempts to Determine the Thickness and Refractive Index of Unimolecular Films

Richard D. Mattuck
J. Opt. Soc. Am. 46(8) 615-620 (1956)

Calculator for Thin Film Measurements

W. A. Feibelman
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Ellipsometric Method for the Determination of All the Optical Parameters of the System of an Isotropic Nonabsorbing Film on an Isotropic Absorbing Substrate. Optical Constants of Silicon*

K. Vedam, W. Knausenberger, and F. Lukes
J. Opt. Soc. Am. 59(1) 64-71 (1969)

Wear Resistance of Magnesium Fluoride Films on Glass

L. Holland and E. W. Van Dam
J. Opt. Soc. Am. 46(10) 773-777 (1956)