Abstract

Since long slits are used in infra-red spectrometers, the image of the exit slit formed by the ellipsoidal mirror will suffer aberrations which lower the sensitivity and tend to increase the time of response. General formulas are derived for these aberrations, and a typical aberration pattern is computed. It is shown how the formulas may be applied to choose the most favorable eccentricity of the ellipsoidal mirror. The relation between the general formulas and a formula given by Randall and Firestone is discussed.

© 1949 Optical Society of America

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