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Optica Publishing Group
  • Journal of Lightwave Technology
  • Vol. 38,
  • Issue 14,
  • pp. 3775-3780
  • (2020)

Highly-Sensitive Indirect-Conversion X-Ray Detector With an Embedded Photodiode Formed by a Three-Dimensional Dual-Gate Thin-Film Transistor

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Abstract

This article reports on a highly-sensitive indirect-conversion X-ray detector with an embedded photodiode formed by a scintillator-coupled 3-D photosensitive thin-film transistor. A high X-ray sensitivity up to 2.5 × 105 μC·Gy−1·cm−2 at a dose of 1 mGy is achieved due to full photon utilization and a high photo gain of ∼104 by operating it in an active pixel sensor format. These performance characteristics make it a great promise for low-dose and high-spatial resolution large-area indirect-conversion X-ray detection.

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